Wen Lea Pearn
According to our database1,
Wen Lea Pearn
authored at least 73 papers
between 1987 and 2023.
Collaborative distances:
Collaborative distances:
Timeline
1990
1995
2000
2005
2010
2015
2020
0
1
2
3
4
5
6
7
8
1
1
1
1
2
1
1
1
7
2
7
2
4
3
6
4
5
4
5
4
1
1
2
2
1
1
1
1
1
Legend:
Book In proceedings Article PhD thesis Dataset OtherLinks
Online presence:
On csauthors.net:
Bibliography
2023
J. Oper. Res. Soc., January, 2023
2021
Qual. Reliab. Eng. Int., 2021
2019
A note on Group Selection with multiple quality characteristics: power comparison of two methods.
Int. J. Prod. Res., 2019
2018
Qual. Reliab. Eng. Int., 2018
2017
Dynamic operating policy for the controllable queue with two removable unreliable servers.
Int. J. Comput. Math. Comput. Syst. Theory, 2017
Commun. Stat. Simul. Comput., 2017
2016
An enhanced model for the integrated production and transportation problem in a multiple vehicles environment.
Soft Comput., 2016
2015
Product mix determination and capacity allocation for heterogeneous products in thin film transistor liquid crystal display manufacturing.
Comput. Ind. Eng., 2015
2014
Qual. Reliab. Eng. Int., 2014
2013
Yield-Related Process Capability Indices for Processes of Multiple Quality Characteristics.
Qual. Reliab. Eng. Int., 2013
A Note on "Capability Assessment for Processes with Multiple Characteristics: A Generalization of the Popular Index <i>C</i><sub>pk</sub>".
Qual. Reliab. Eng. Int., 2013
An Extension of the Product Acceptance Determination for One-Sided Process with Multiple Characteristics.
Qual. Reliab. Eng. Int., 2013
Supplier Selection Critical Decision Values for Processes with Multiple Independent Lines.
Qual. Reliab. Eng. Int., 2013
A Close Form Solution for the Product Acceptance Determination Based on the Popular Index <i>C<sub>pk</sub></i>.
Qual. Reliab. Eng. Int., 2013
Qual. Reliab. Eng. Int., 2013
Comput. Ind. Eng., 2013
2012
A batch arrival queue under randomised multi-vacation policy with unreliable server and repair.
Int. J. Syst. Sci., 2012
Production yield measure for multiple characteristics processes based on \({S_{pk}^T}\) under multiple samples.
Central Eur. J. Oper. Res., 2012
2011
Capability assessment for processes with multiple characteristics: A generalization of the popular index <i>C</i><sub><i>pk</i></sub>.
Qual. Reliab. Eng. Int., 2011
Multi-server retrial queue with second optional service: algorithmic computation and optimisation.
Int. J. Syst. Sci., 2011
Optimal management for infinite capacity <i>N</i>-policy M/G/1 queue with a removable service station.
Int. J. Syst. Sci., 2011
Comparative analysis of a randomized N-policy queue: An improved maximum entropy method.
Expert Syst. Appl., 2011
Expert Syst. Appl., 2011
Optimal production run time for two-stage production system with imperfect processes and allowable shortages.
Central Eur. J. Oper. Res., 2011
The performance measures and randomized optimization for an unreliable server M<sup>[x]</sup>/G/1 vacation system.
Appl. Math. Comput., 2011
2010
Process selection for higher production yield based on capability index <i>S</i><sub><i>pk</i></sub>.
Qual. Reliab. Eng. Int., 2010
Comparison of two randomized policy M/G/1 queues with second optional service, server breakdown and startup.
J. Comput. Appl. Math., 2010
2009
Fast and effective algorithms for the liquid crystal display module (LCM) scheduling problem with sequence-dependent setup time.
J. Oper. Res. Soc., 2009
Eur. J. Oper. Res., 2009
Sample size determination for production yield estimation with multiple independent process characteristics.
Eur. J. Oper. Res., 2009
An Improved Approach for Estimating Product Performance Based on the Capability Index <i>C</i><sub><i>pmk</i></sub>.
Commun. Stat. Simul. Comput., 2009
2008
J. Oper. Res. Soc., 2008
Capability adjustment for gamma processes with mean shift consideration in implementing Six Sigma program.
Eur. J. Oper. Res., 2008
2007
Measuring process capability based on <i>C</i><sub><i>pmk</i></sub> with gauge measurement errors.
Qual. Reliab. Eng. Int., 2007
Microelectron. Reliab., 2007
J. Oper. Res. Soc., 2007
Eur. J. Oper. Res., 2007
Accuracy Analysis of the Percentile Method for Estimating Non Normal Manufacturing Quality.
Commun. Stat. Simul. Comput., 2007
On the Sampling Distributions of the Estimated Process Loss Indices with Asymmetric Tolerances.
Commun. Stat. Simul. Comput., 2007
2006
Encyclopedia and Handbook of Process Capability Indices - A Comprehensive Exposition of Quality Control Measures
Series on Quality, Reliability and Engineering Statistics 12, WorldScientific, ISBN: 978-981-4478-11-3, 2006
Qual. Reliab. Eng. Int., 2006
Variables sampling plans with PPM fraction of defectives and process loss consideration.
J. Oper. Res. Soc., 2006
Int. J. Syst. Sci., 2006
Production quality and yield assurance for processes with multiple independent characteristics.
Eur. J. Oper. Res., 2006
2005
Microelectron. Reliab., 2005
Cost benefit analysis of series systems with warm standby components and general repair time.
Math. Methods Oper. Res., 2005
Int. J. Syst. Sci., 2005
Eur. J. Oper. Res., 2005
Maximum entropy analysis to the N policy M/G/1 queueing system with server breakdowns and general startup times.
Appl. Math. Comput., 2005
2004
Algorithms for the wafer probing scheduling problem with sequence-dependent set-up time and due date restrictions.
J. Oper. Res. Soc., 2004
Optimal management of the <i>N</i>-policy <i>M</i>/<i>E</i><sub><i>k</i></sub>/1 queuing system with a removable service station: a sensitivity investigation.
Comput. Oper. Res., 2004
Testing process performance based on capability index C<sub>pk</sub> with critical values.
Comput. Ind. Eng., 2004
Sensitivity analysis of the optimal management policy for a queuing system with a removable and non-reliable server.
Comput. Ind. Eng., 2004
2003
Erratum to "An algorithm for calculating the lower confidence bounds of C<sub>PU</sub> and C<sub>PL</sub> with application to low-drop-out linear regulators" [Microelectronics Reliability 2003;43: 495-502].
Microelectron. Reliab., 2003
Manufacturing capability control for multiple power-distribution switch processes based on modified C<sub>pk</sub> MPPAC.
Microelectron. Reliab., 2003
An algorithm for calculating the lower confidence bounds of C<sub>PU</sub> and C<sub>PL</sub> with application to low-drop-out linear regulators.
Microelectron. Reliab., 2003
A reliable procedure for testing linear regulators with one-sided specification limits based on multiple samples.
Microelectron. Reliab., 2003
Math. Methods Oper. Res., 2003
2002
A multiprocess performance analysis chart based on the incapability index C<sub>pp</sub>: an application to the chip resistors.
Microelectron. Reliab., 2002
Testing process capability for one-sided specification limit with application to the voltage level translator.
Microelectron. Reliab., 2002
Testing process performance based on the yield: an application to the liquid-crystal display module.
Microelectron. Reliab., 2002
1999
Comput. Oper. Res., 1999
1998
1995
Comput. Oper. Res., 1995
1994
1991
Comput. Oper. Res., 1991
1989
Comput. Oper. Res., 1989
1988
1987