Wen-Kuan Yeh
According to our database1,
Wen-Kuan Yeh
authored at least 11 papers
between 2007 and 2020.
Collaborative distances:
Collaborative distances:
Timeline
Legend:
Book In proceedings Article PhD thesis Dataset OtherLinks
On csauthors.net:
Bibliography
2020
Substrate Bias Effect on Dynamic Characteristics of a Monolithically Integrated GaN Half-Bridge.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
2019
Relationship of Channel and Surface Orientation to Mechanical and Electrical Stresses on N-Type FinFETs.
IEICE Trans. Electron., 2019
2016
Influence of fin number on hot-carrier injection stress induced degradation in bulk FinFETs.
Microelectron. Reliab., 2016
2014
Reliability of the doping concentration in an ultra-thin body and buried oxide silicon on insulator (SOI) and comparison with a partially depleted SOI.
Microelectron. Reliab., 2014
Using Capacitance Sensor to Extract Characteristic Signals of Dozing from Skin Surface.
J. Sensors, 2014
2013
The impact of interface/border defect on performance and reliability of high-k/metal-gate CMOSFET.
Microelectron. Reliab., 2013
2011
Microelectron. Reliab., 2011
2010
Impact of strain on hot electron reliability of dual-band power amplifier and integrated LNA-mixer RF performances.
Microelectron. Reliab., 2010
Improvement of TDDB reliability, characteristics of HfO<sub>2</sub> high-k/metal gate MOSFET device with oxygen post deposition annealing.
Microelectron. Reliab., 2010
2008
Significantly improving sub-90 nm CMOSFET performances with notch-gate enhanced high tensile-stress contact etch stop layer.
Microelectron. Reliab., 2008
2007
The impacts of high tensile stress CESL and geometry design on device performance and reliability for 90 nm SOI nMOSFETs.
Microelectron. Reliab., 2007