Weiran Kong

According to our database, Weiran Kong authored at least 9 papers between 2008 and 2019.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2019

Demonstration of improvement of specific on-resistance versus breakdown voltage tradeoff for low-voltage power LDMOS.

Zhaozhao Xu, Donghua Liu, Jun Hu, Feng Jin, Xinjie Yang, Wenting Duan, Wei Yue, Ziquan Fang, Wensheng Qian, Weiran Kong, Shichang Zou

Microelectron. J., 2019

2018

A 280-KBytes Twin-Bit-Cell Embedded NOR Flash Memory With a Novel Sensing Current Protection Enhanced Technique and High-Voltage Generating Systems.

Yiran Xu, Wenyi Zhu, Jun Xiao, Guangjun Yang, Jian Hu, Shengbo Zhang, Mingyong Huang, Weiran Kong, Shichang Zou

IEEE Trans. Circuits Syst. II Express Briefs, 2018

Investigation and impact of LDD variations on the drain disturb in normally-on SONOS NOR flash device.

Zhaozhao Xu, Donghua Liu, Wei Xiong, Jun Hu, Wenting Duan, Hualun Chen, Wensheng Qian, Weiran Kong, Shichang Zou

Microelectron. Reliab., 2018

2017

Investigation of read disturb in split-gate memory and its feasible solution.

Wenyi Zhu, Binghan Li, Tao Yu, Weiran Kong, Shichang Zou

Microelectron. Reliab., 2017

A duplex current-reused CMOS LNA with complementary derivative superposition technique.

Ruofan Dai, Yunlong Zheng, Jun He, Weiran Kong, Shichang Zou

Int. J. Circuit Theory Appl., 2017

Area-efficient charge pump with local boost technique for embedded flash memory.

Yiran Xu, Wenyi Zhu, Jun Xiao, Guangjun Yang, Jian Hu, Xiaoyun Li, Weiran Kong, Shichang Zou

IEICE Electron. Express, 2017

2016

Design Techniques for a 30-ns Access Time 1.5-V 200-KB Embedded EEPROM Memory.

Yiran Xu, Jian Hu, Jun Xiao, Guangjun Yang, Weiran Kong

IEEE Trans. Circuits Syst. II Express Briefs, 2016

A 0.5-V novel complementary current-reused CMOS LNA for 2.4 GHz medical application.

Ruofan Dai, Yunlong Zheng, Jun He, Guojun Liu, Weiran Kong, Shichang Zou

Microelectron. J., 2016

2008

Investigation of charge trapping/de-trapping induced operation lifetime degradation in triple SuperFlash^® memory cell.

Zigui Cao, Bo Zhang, Xiong Zhang, Elton Lee, Weiran Kong

Microelectron. Reliab., 2008