Wei Zhao

According to our database, Wei Zhao authored at least 10 papers between 2010 and 2021.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2021

A Survey of Test and Reliability Solutions for Magnetic Random Access Memories.

Patrick Girard, Yuanqing Cheng, Arnaud Virazel, Wei Zhao, Rajendra Bishnoi, Mehdi B. Tahoori

Proc. IEEE, 2021

2013

Power-safe application of tdf patterns to flip-chip designs during wafer test.

Wei Zhao, Junxia Ma, Mohammad Tehranipoor, Sreejit Chakravarty

ACM Trans. Design Autom. Electr. Syst., 2013

2012

Ensuring Power-Safe Application of Test Patterns Using an Effective Gating Approach Considering Current Limits.

Wei Zhao, Mohammad Tehranipoor, Sreejit Chakravarty

J. Low Power Electron., 2012

Layout-Aware Pattern Evaluation and Analysis for Power-Safe Application of Transition Delay Fault Patterns.

Hassan Salmani, Wei Zhao, Mohammad Tehranipoor, Sreejit Chakravarty, Patrick Girard, Xiaoqing Wen

J. Low Power Electron., 2012

A novel method for fast identification of peak current during test.

Wei Zhao, Sreejit Chakravarty, Junxia Ma, Narendra Devta-Prasanna, Fan Yang, Mohammad Tehranipoor

Proceedings of the 30th IEEE VLSI Test Symposium, 2012

PowerMAX: Fast Power Analysis during Test.

Wei Zhao, Mohammad Tehranipoor

Proceedings of the 21st IEEE Asian Test Symposium, 2012

2011

Power-safe test application using an effective gating approach considering current limits.

Wei Zhao, Mohammad Tehranipoor, Sreejit Chakravarty

Proceedings of the 29th IEEE VLSI Test Symposium, 2011

Peak power identification on power bumps during test application.

Wei Zhao, Mohammad Tehranipoor

Proceedings of the 2011 International Green Computing Conference and Workshops, 2011

2010

Analysis of power consumption and transition fault coverage for LOS and LOC testing schemes.

Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Junxia Ma, Wei Zhao, Mohammad Tehranipoor, Xiaoqing Wen

Proceedings of the 13th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2010

Power-Safe Application of Transition Delay Fault Patterns Considering Current Limit during Wafer Test.

Wei Zhao, Junxia Ma, Mohammad Tehranipoor, Sreejit Chakravarty

Proceedings of the 19th IEEE Asian Test Symposium, 2010