Wei Zhang
Affiliations:- University of Minnesota, Department of Electrical and Computer Engineering, Twin Cities, MN, USA (PhD 2012)
According to our database1,
Wei Zhang
authored at least 8 papers
between 2009 and 2013.
Collaborative distances:
Collaborative distances:
Timeline
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Online presence:
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on ece.umn.edu
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Bibliography
2013
A Write-Back-Free 2T1D Embedded DRAM With Local Voltage Sensing and a Dual-Row-Access Low Power Mode.
IEEE Trans. Circuits Syst. I Regul. Pap., 2013
2012
An SRAM Reliability Test Macro for Fully Automated Statistical Measurements of V<sub>MIN</sub> Degradation.
IEEE Trans. Circuits Syst. I Regul. Pap., 2012
A 2T1C Embedded DRAM Macro With No Boosted Supplies Featuring a 7T SRAM Based Repair and a Cell Storage Monitor.
IEEE J. Solid State Circuits, 2012
2011
An Array-Based Odometer System for Statistically Significant Circuit Aging Characterization.
IEEE J. Solid State Circuits, 2011
A 1V printed organic DRAM cell based on ion-gel gated transistors with a sub-10nW-per-cell Refresh Power.
Proceedings of the IEEE International Solid-State Circuits Conference, 2011
A 700MHz 2T1C embedded DRAM macro in a generic logic process with no boosted supplies.
Proceedings of the IEEE International Solid-State Circuits Conference, 2011
2010
Proceedings of the 2010 International Symposium on Low Power Electronics and Design, 2010
2009
An SRAM reliability test macro for fully-automated statistical measurements of Vmin degradation.
Proceedings of the IEEE Custom Integrated Circuits Conference, 2009