Wei Xu
Affiliations:- Marvell Technology, Santa Clara, CA, USA (since 2009)
- Rensselaer Polytechnic Institute, Electrical and Computer Science Engineering Department, Troy, NY, USA (PhD 2009)
According to our database1,
Wei Xu
authored at least 13 papers
between 2008 and 2013.
Collaborative distances:
Collaborative distances:
Timeline
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Bibliography
2013
IEEE Trans. Very Large Scale Integr. Syst., 2013
Using Multilevel Phase Change Memory to Build Data Storage: A Time-Aware System Design Perspective.
IEEE Trans. Computers, 2013
2012
IEEE Trans. Very Large Scale Integr. Syst., 2012
A 130 nm 1.2 V/3.3 V 16 Kb Spin-Transfer Torque Random Access Memory With Nondestructive Self-Reference Sensing Scheme.
IEEE J. Solid State Circuits, 2012
2011
A Time-Aware Fault Tolerance Scheme to Improve Reliability of Multilevel Phase-Change Memory in the Presence of Significant Resistance Drift.
IEEE Trans. Very Large Scale Integr. Syst., 2011
IEEE Trans. Very Large Scale Integr. Syst., 2011
2010
Design of Spin-Torque Transfer Magnetoresistive RAM and CAM/TCAM with High Sensing and Search Speed.
IEEE Trans. Very Large Scale Integr. Syst., 2010
Using time-aware memory sensing to address resistance drift issue in multi-level phase change memory.
Proceedings of the 11th International Symposium on Quality of Electronic Design (ISQED 2010), 2010
Combined magnetic- and circuit-level enhancements for the nondestructive self-reference scheme of STT-RAM.
Proceedings of the 2010 International Symposium on Low Power Electronics and Design, 2010
A nondestructive self-reference scheme for Spin-Transfer Torque Random Access Memory (STT-RAM).
Proceedings of the Design, Automation and Test in Europe, 2010
2009
Proceedings of the 2009 International Symposium on Low Power Electronics and Design, 2009
Improving STT MRAM storage density through smaller-than-worst-case transistor sizing.
Proceedings of the 46th Design Automation Conference, 2009
2008
Spin-transfer torque magnetoresistive content addressable memory (CAM) cell structure design with enhanced search noise margin.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2008), 2008