Wei Li

According to our database, Wei Li authored at least 5 papers between 2003 and 2005.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2005

Distance Restricted Scan Chain Reordering to Enhance Delay Fault Coverage.

Wei Li, Seongmoon Wang, Srimat T. Chakradhar, Sudhakar M. Reddy

Proceedings of the 18th International Conference on VLSI Design (VLSI Design 2005), 2005

On Reducing Peak Current and Power during Test.

Wei Li, Sudhakar M. Reddy, Irith Pomeranz

Proceedings of the 2005 IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2005), 2005

2004

On test generation for transition faults with minimized peak power dissipation.

Wei Li, Sudhakar M. Reddy, Irith Pomeranz

Proceedings of the 41th Design Automation Conference, 2004

2003

An Improved Markov Source Design for Scan BIST.

Chaowen Yu, Wei Li, Sudhakar M. Reddy, Irith Pomeranz

Proceedings of the 9th IEEE International On-Line Testing Symposium (IOLTS 2003), 2003

A scan BIST generation method using a markov source and partial bit-fixing.

Wei Li, Chaowen Yu, Sudhakar M. Reddy, Irith Pomeranz

Proceedings of the 40th Design Automation Conference, 2003