Wei-Chung Kao

According to our database, Wei-Chung Kao authored at least 2 papers between 2007 and 2010.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2010

DFT and Minimum Leakage Pattern Generation for Static Power Reduction During Test and Burn-In.

Wei-Chung Kao, Wei-Shun Chuang, Shiu-Ting Lin, Chien-Mo James Li, Vasco Manquinho

IEEE Trans. Very Large Scale Integr. Syst., 2010

2007

Response Inversion Scan Cell (RISC): A Peak Capture Power Reduction Technique.

Bo-Hua Chen, Wei-Chung Kao, Bing-Chuan Bai, Shyue-Tsong Shen, James C.-M. Li

Proceedings of the 16th Asian Test Symposium, 2007