Wayne M. Needham

According to our database, Wayne M. Needham authored at least 9 papers between 1996 and 1999.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

1999

Nanometer Technology Challenges for Test and Test Equipment.

Wayne M. Needham

Computer, 1999

1998

Guest Editor's Introduction: Microprocessor Testing Today.

Wayne M. Needham

IEEE Des. Test Comput., 1998

Best Methods for At-Speed Testing?

Peter C. Maxwell, Steve Baird, Wayne M. Needham, Al Crouch, Phil Nigh

Proceedings of the 16th IEEE VLSI Test Symposium (VTS '98), 28 April, 1998

High volume microprocessor test escapes, an analysis of defects our tests are missing.

Wayne M. Needham, Cheryl Prunty, Yeoh Eng Hong

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

Just how real is the SIA roadmap.

Wayne M. Needham

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

1997

An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing.

Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken

Proceedings of the 15th IEEE VLSI Test Symposium (VTS'97), 1997

Microprocessor Test and Validation: Any New Avenues?

Magdy S. Abadir, Jacob A. Abraham, Hong Hao, C. Hunter, Wayne M. Needham, Ron G. Walther

Proceedings of the 15th IEEE VLSI Test Symposium (VTS'97), 1997

So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment.

Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken, Wojciech Maly

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

1996

DFT Strategy for Intel Microprocessors.

Wayne M. Needham, Naga Gollakota

Proceedings of the Proceedings IEEE International Test Conference 1996, 1996