Wayne B. Nelson

Orcid: 0000-0002-8896-6664

According to our database¹, Wayne B. Nelson authored at least 7 papers between 1973 and 2024.

Collaborative distances:

Dijkstra number² of six.
Erdős number³ of six.

Timeline

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Book

In proceedings

Article

PhD thesis

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Bibliography

2024

Advances in Accelerated Life Tests With Step and Varying Stress.

[BibT_eX]

[DOI]

Wayne B. Nelson

IEEE Trans. Reliab., March, 2024

2021

Statistical Methods for Reliability Data, Second Edition, .

[BibT_eX]

[DOI]

Wayne B. Nelson

Technometrics, 2021

2008

Residuals and Their Analyses for Accelerated Life Tests With Step and Varying Stress.

[BibT_eX]

[DOI]

Wayne B. Nelson

IEEE Trans. Reliab., 2008

2005

A bibliography of accelerated test plans part II - references.

[BibT_eX]

[DOI]

Wayne B. Nelson

IEEE Trans. Reliab., 2005

A bibliography of accelerated test plans.

[BibT_eX]

[DOI]

Wayne B. Nelson

IEEE Trans. Reliab., 2005

2000

Theory and Applications of Hazard Plotting for Censored Failure Data.

[BibT_eX]

[DOI]

Wayne B. Nelson

Technometrics, 2000

1973

More effective computer packages for applications.

[BibT_eX]

[DOI]

Wayne B. Nelson

Mary Phillips

Linda Thumhart

Proceedings of the American Federation of Information Processing Societies: 1973 National Computer Conference, 1973

Wayne B. Nelson

Timeline

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Bibliography

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