Ward De Ceuninck

According to our database, Ward De Ceuninck authored at least 19 papers between 2001 and 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2018

Mechanical and chemical adhesion at the encapsulant interfaces in laminated photovoltaic modules.

Philippe Nivelle, Tom Borgers, Eszter Voroshazi, Jef Poortmans, Jan D'Haen, Ward De Ceuninck, Michael Daenen

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2017

Single-Shot Detection of Neurotransmitters in Whole-Blood Samples by Means of the Heat-Transfer Method in Combination with Synthetic Receptors.

Thijs Vandenryt, Bart van Grinsven, Kasper Eersels, Peter Cornelis, Safira Kholwadia, Thomas Cleij, Ronald Thoelen, Ward De Ceuninck, Marloes Peeters, Patrick H. Wagner

Sensors, 2017

2014

Array Formatting of the Heat-Transfer Method (HTM) for the Detection of Small Organic Molecules by Molecularly Imprinted Polymers.

Gideon Wackers, Thijs Vandenryt, Peter Cornelis, Evelien Kellens, Ronald Thoelen, Ward De Ceuninck, Patricia Losada-Pérez, Bart van Grinsven, Marloes Peeters, Patrick H. Wagner

Sensors, 2014

2013

Combining Electrochemical Impedance Spectroscopy and Surface Plasmon Resonance into one Simultaneous Read-Out System for the Detection of Surface Interactions.

Thijs Vandenryt, Andrea Pohl, Bart van Grinsven, Ronald Thoelen, Ward De Ceuninck, Patrick H. Wagner, Jörg Opitz

Sensors, 2013

Optimizing the Thermal Read-Out Technique for MIP-Based Biomimetic Sensors: Towards Nanomolar Detection Limits.

Bram Geerets, Marloes Peeters, Bart van Grinsven, Karolien Bers, Ward De Ceuninck, Patrick H. Wagner

Sensors, 2013

2012

Embedded Unit for Point-of-Care Impedance Based Biosensor Readout.

Jeroen Broeders, Dieter Croux, Ans Weustenraed, Thomas Cleij, Patrick H. Wagner, Ward De Ceuninck, Wouter Vanaken, Stijn Duchateau, Ronald Thoelen

Proceedings of the 14th IEEE International Conference on High Performance Computing and Communication & 9th IEEE International Conference on Embedded Software and Systems, 2012

2007

Lifetime modeling of intrinsic gate oxide breakdown at high temperature.

R. Moonen, Piet Vanmeerbeek, G. Lekens, Ward De Ceuninck, Peter Moens, J. Boutsen

Microelectron. Reliab., 2007

2005

A new method for the lifetime determination of submicron metal interconnects by means of a parallel test structure.

Kris Vanstreels, Marc D'Olieslaeger, Ward De Ceuninck, Jan D'Haen, Karen Maex

Microelectron. Reliab., 2005

2004

MTF test system with AC based dynamic joule correction for electromigration tests on interconnects.

Leen Biesemans, K. Schepers, Kris Vanstreels, Jan D'Haen, Ward De Ceuninck, Marc D'Olieslaeger

Microelectron. Reliab., 2004

Evidence for source side injection hot carrier effects on lateral DMOS transistors.

Stefano Aresu, Ward De Ceuninck, Geert Van den Bosch, Guido Groeseneken, Peter Moens, Jean Manca, D. Wojciechowski, P. Gassot

Microelectron. Reliab., 2004

2003

Advantage of In-situ over Ex-situ techniques as reliability tool: Aging kinetics of Imec's MCM-D discrete passives devices.

Philippe Soussan, G. Lekens, R. Dreesen, Ward De Ceuninck, Eric Beyne

Microelectron. Reliab., 2003

A new method for the analysis of high-resolution SILC data.

Stefano Aresu, Ward De Ceuninck, G. Knuyt, J. Mertens, Jean Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger, Jan D'Haen

Microelectron. Reliab., 2003

2002

How reliable are reliability tests?

Luc Tielemans, R. Rongen, Ward De Ceuninck

Microelectron. Reliab., 2002

Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technology.

R. Petersen, Ward De Ceuninck, Jan D'Haen, Marc D'Olieslaeger, Luc De Schepper, Olivier Vendier, Hervé Blanck, Dominique Pons

Microelectron. Reliab., 2002

High-resolution SILC measurements of thin SiO₂ at ultra low voltages.

Stefano Aresu, Ward De Ceuninck, R. Dreesen, Kris Croes, E. Andries, Jean Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger

Microelectron. Reliab., 2002

Statistical aspects of the degradation of LDD nMOSFETs.

E. Andries, R. Dreesen, Kris Croes, Ward De Ceuninck, Luc De Schepper, Guido Groeseneken, K. F. Lo, Marc D'Olieslaeger, Jan D'Haen

Microelectron. Reliab., 2002

2001

Determination of the thermal resistance and current exponent of heterojunction bipolar transistors for reliability evaluation.

R. Petersen, Ward De Ceuninck, Luc De Schepper, Olivier Vendier, Hervé Blanck, Dominique Pons

Microelectron. Reliab., 2001

A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradation.

R. Dreesen, Kris Croes, Jean Manca, Ward De Ceuninck, Luc De Schepper, A. Pergoot, Guido Groeseneken

Microelectron. Reliab., 2001

High-resolution in-situ of gold electromigration: test time reduction.

Kris Croes, R. Dreesen, Jean Manca, Ward De Ceuninck, Luc De Schepper, Luc Tielemans, P. J. van der Wel

Microelectron. Reliab., 2001