Wangyong Chen
Orcid: 0000-0001-5545-2168
According to our database1,
Wangyong Chen
authored at least 7 papers
between 2019 and 2025.
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Bibliography
2025
Change point detection in temporal networks based on graph snapshot similarity measures.
Appl. Math. Comput., 2025
2024
Exploring thermal effects of advanced backside power delivery network beyond 3 nm node.
Microelectron. J., 2024
2023
Enhancing Temperature Immunity of Digital Circuit Against Aging : The Standard Cell Subset Method.
Proceedings of the 15th IEEE International Conference on ASIC, 2023
Machine Learning-Assisted Single-Event Transient Model of 12nm FinFETs for Circuit-Level Simulation.
Proceedings of the 15th IEEE International Conference on ASIC, 2023
2021
A physics-based electromigration reliability model for interconnects lifetime prediction.
Sci. China Inf. Sci., 2021
2019
Sci. China Inf. Sci., 2019
Self-heating Induced Variability and Reliability in Advanced Logic Devices and Circuits.
Proceedings of the 13th IEEE International Conference on ASIC, 2019