W. Yun

According to our database, W. Yun authored at least 2 papers between 1998 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Laboratory X-Ray-Assisted Device Alteration for Fault Isolation and Post-Silicon Debug.

K. C. Celio, S. Sen, E. Nisenboim, P. M. Pardy, B. Nguyen, V. Le, W. Nolting, S. Kumar, C. A. Peterson, A. Raveh, K. Johnson, B. Stripe, F. Su, M. Lun, S. Lewis, R. I. Spink, W. Yun

Proceedings of the IEEE International Reliability Physics Symposium, 2024

1998

Warranty cost analysis under continuous sales.

W. Yun, I. Moon

J. Oper. Res. Soc., 1998