W. H. Teh

According to our database, W. H. Teh authored at least 1 paper in 2009.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2009

Wafer Thickness Sensor (WTS) for etch depth measurement of TSV.

David Marx, David Grant, Russ Dudley, Andy Rudack, W. H. Teh

Proceedings of the IEEE International Conference on 3D System Integration, 2009