W. Dauksher
According to our database1,
W. Dauksher
authored at least 2 papers
between 2003 and 2006.
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Bibliography
2006
Microelectron. Reliab., 2006
2003
An examination of the applicability of the DNP metric on first level reliability assessments in underfilled electronic packages.
Microelectron. Reliab., 2003