W. B. Chen

According to our database, W. B. Chen authored at least 4 papers between 2007 and 2013.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2013

A novel soldering method to evaluate PCB pad cratering for pin-pull testing.

Miao Cai, D. J. Xie, W. B. Chen, B. Y. Wu, Dao-Guo Yang, G. Q. Zhang

Microelectron. Reliab., 2013

2008

A 2D threshold-voltage model for small MOSFET with quantum-mechanical effects.

Jing-Ping Xu, Y. P. Li, Pui-To Lai, W. B. Chen, S. G. Xu, J. G. Guan

Microelectron. Reliab., 2008

2007

A threshold-voltage model of SiGe-channel pMOSFET without Si cap layer.

X. Zou, Jing-Ping Xu, C. X. Li, Pui-To Lai, W. B. Chen

Microelectron. Reliab., 2007

Gate leakage properties of MOS devices with tri-layer high-k gate dielectric.

W. B. Chen, Jing-Ping Xu, Pui-To Lai, Y. P. Li, S. G. Xu

Microelectron. Reliab., 2007