Von-Kyoung Kim

According to our database, Von-Kyoung Kim authored at least 5 papers between 1996 and 1999.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

1999

On comparing functional fault coverage and defect coverage for memory testing.

Von-Kyoung Kim, Tom Chen

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1999

Fault Coverage Estimation for Early Stage of VLSI Design.

Von-Kyoung Kim, Tom Chen, Mick Tegethoff

Proceedings of the 9th Great Lakes Symposium on VLSI (GLS-VLSI '99), 1999

Assessing Defect Coverage of Memory Testing Algorithms.

Von-Kyoung Kim, Tom Chen

Proceedings of the 9th Great Lakes Symposium on VLSI (GLS-VLSI '99), 1999

1997

ASIC Manufacturing Test Cost Prediction at Early Design Stage.

Von-Kyoung Kim, Tom Chen, Mick Tegethoff

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

1996

ASIC Yield Estimation at Early Design Cycle.

Von-Kyoung Kim, Mick Tegethoff, Tom Chen

Proceedings of the Proceedings IEEE International Test Conference 1996, 1996