Volker Meyer

According to our database, Volker Meyer authored at least 8 papers between 2001 and 2015.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2015

Integration of Data Mining Results into Multi-dimensional Data Models.

Volker Meyer, Wolfram Höpken, Matthias Fuchs, Maria Lexhagen

Proceedings of the Information and Communication Technologies in Tourism 2015, 2015

2013

Towards a flood risk assessment ontology - Knowledge integration into a multi-criteria risk assessment approach.

Sebastian Scheuer, Dagmar Haase, Volker Meyer

Comput. Environ. Urban Syst., 2013

2005

ABCD Modeling of Crosstalk Coupling Noise to Analyze the Signal Integrity Losses on the Victim Interconnect in DSM Chips.

Ajoy Kumar Palit, Volker Meyer, Walter Anheier, Jürgen Schlöffel

Proceedings of the 18th International Conference on VLSI Design (VLSI Design 2005), 2005

2004

Modeling and Analysis of Crosstalk Coupling Effect on the Victim Interconnect Using the ABCD Network Model.

Ajoy Kumar Palit, Volker Meyer, Walter Anheier, Jürgen Schlöffel

Proceedings of the 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 2004

2002

Transport of quantum states and separation of ions in a dual RF ion trap.

M. A. Rowe, Amit Ben-Kish, Brian Demarco, Dietrich Leibfried, Volker Meyer, Jim Beall, Joe Britton, J. Hughes, Wayne M. Itano, Brana Jelenkovic, Chris Langer, Till Rosenband, David J. Wineland

Quantum Inf. Comput., 2002

Non-robust delay test pattern enhancement.

Volker Meyer, Walter Anheier, Arne Sticht

Proceedings of the 2002 9th IEEE International Conference on Electronics, 2002

2001

Recent results in trapped-ion quantum computing at NIST.

David Kielpinski, Amit Ben-Kish, Joe Britton, Volker Meyer, Mary A. Rowe, Wayne M. Itano, David J. Wineland, Charles Sackett, Christopher R. Monroe

Quantum Inf. Comput., 2001

Non-robust delay test pattern generation based on stuck-at TPG.

Volker Meyer, Walter Anheier, Arne Sticht

Proceedings of the 2001 8th IEEE International Conference on Electronics, 2001