Vitor A. P. de Aguiar

According to our database, Vitor A. P. de Aguiar authored at least 6 papers between 2017 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

Reliability Assessment of Arm Cortex-M Processors under Heavy Ions and Emulated Fault Injection.

Leonardo R. Gobatto, Fabio Benevenuti, Nemitala Added, Saulo G. Alberton, Eduardo L. A. Macchione, Vitor A. P. Aguiar, Nilberto H. Medina, Fernanda Lima Kastensmidt, José Rodrigo Azambuja

Proceedings of the 25th IEEE Latin American Test Symposium, 2024

Heavy Ion-Induced Faults on Programmable UART Controllers Embedded into SRAM-Based FPGA.

Victor O. Costa, Fabio Benevenuti, Renan Menezes, Lidia Shibuya Sato, Luis Loures, Fernanda Lima Kastensmidt, Nemitala Added, Saulo G. Alberton, Vitor A. P. Aguiar, Nilberto H. Medina

Proceedings of the 25th IEEE Latin American Test Symposium, 2024

2023

Evaluating the Reliability of Different Voting Schemes for Fault Tolerant Approximate Systems.

Tiago R. Balen, Carlos J. González, Ingrid F. V. Oliveira, Leomar S. da Rosa Jr., Rafael Iankowski Soares, Rafael B. Schvittz, Nemitala Added, Eduardo L. A. Macchione, Vitor A. P. Aguiar, Marcilei Aparecida Guazzelli, Nilberto H. Medina, Paulo F. Butzen

J. Electron. Test., August, 2023

2021

Reliability Evaluation of Voters for Fault Tolerant Approximate Systems.

Tiago R. Balen, Carlos J. González, Ingrid F. V. Oliveira, Rafael B. Schvittz, Nemitala Added, Eduardo L. A. Macchione, Vitor A. P. de Aguiar, Marcilei Aparecida Guazzelli, Nilberto H. Medina, Paulo F. Butzen

Proceedings of the 22nd IEEE Latin American Test Symposium, 2021

2017

Analysis of single-event upsets in a Microsemi ProAsic3E FPGA.

Paulo Ricardo Cechelero Villa, Roger C. Goerl, Fabian Vargas, Leticia B. Poehls, Nilberto H. Medina, Nemitala Added, Vitor A. P. de Aguiar, Eduardo L. A. Macchione, Fernando Aguirre, Marcilei Aparecida Guazzelli da Silveira, Eduardo Augusto Bezerra

Proceedings of the 18th IEEE Latin American Test Symposium, 2017

Ionizing radiation effects on a COTS low-cost RISC microcontroller.

Felipe G. H. Leite, Roberto B. B. Santos, Nilberto H. Medina, Vitor A. P. Aguiar, Renato C. Giacomini, Nemitala Added, Fernando Aguirre, Eduardo L. A. Macchione, Fabian Vargas, Marcilei Aparecida Guazzelli da Silveira

Proceedings of the 18th IEEE Latin American Test Symposium, 2017