Vishwani D. Agrawal

J. Electron. Test., April, 2024

An Amalgamated Testability Measure Derived from Machine Intelligence.

[BibT_eX]

[DOI]

Proceedings of the 37th International Conference on VLSI Design and 23rd International Conference on Embedded Systems, 2024

Unsupervised Learning Provides Intelligence for Testing Hard to Detect Faults.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Test Conference, 2024

2022

Fault Modeling and Test Generation for Technology-Specific Defects of Skyrmion Logic Circuits.

[BibT_eX]

[DOI]

Proceedings of the 40th IEEE VLSI Test Symposium, 2022

2021

Estimating Operational Age of an Integrated Circuit.

[BibT_eX]

[DOI]

J. Electron. Test., 2021

Defect Characterization and Testing of Skyrmion-Based Logic Circuits.

[BibT_eX]

[DOI]

Proceedings of the 39th IEEE VLSI Test Symposium, 2021

Special Session - Machine Learning in Test: A Survey of Analog, Digital, Memory, and RF Integrated Circuits.

[BibT_eX]

[DOI]

Proceedings of the 39th IEEE VLSI Test Symposium, 2021

Training Neural Network for Machine Intelligence in Automatic Test Pattern Generator.

[BibT_eX]

[DOI]

Proceedings of the 34th International Conference on VLSI Design and 20th International Conference on Embedded Systems, 2021

Unsupervised Learning in Test Generation for Digital Integrated Circuits.

[BibT_eX]

[DOI]

Proceedings of the 26th IEEE European Test Symposium, 2021

2020

Improved Pseudo-Random Fault Coverage Through Inversions: a Study on Test Point Architectures.

[BibT_eX]

[DOI]

J. Electron. Test., 2020

Special Session: Survey of Test Point Insertion for Logic Built-in Self-test.

[BibT_eX]

[DOI]

Yang Sun

Proceedings of the 38th IEEE VLSI Test Symposium, 2020

Message from the Steering Committee Chair.

[BibT_eX]

[DOI]

Proceedings of the 33rd International Conference on VLSI Design and 19th International Conference on Embedded Systems, 2020

Machine Intelligence for Efficient Test Pattern Generation.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Test Conference, 2020

2019

Special Session: Delay Fault Testing - Present and Future.

[BibT_eX]

[DOI]

Proceedings of the 37th IEEE VLSI Test Symposium, 2019

Energy Efficient Power Distribution on Many-Core SoC.

[BibT_eX]

[DOI]

Mustafa M. Shihab

Proceedings of the 32nd International Conference on VLSI Design and 18th International Conference on Embedded Systems, 2019

Two-Pattern ∆IDDQ Test for Recycled IC Detection.

[BibT_eX]

[DOI]

Proceedings of the 32nd International Conference on VLSI Design and 18th International Conference on Embedded Systems, 2019

Technology Characterization Model and Scaling for Energy Management.

[BibT_eX]

[DOI]

Harshil Goyal

Proceedings of the VLSI Design and Test - 23rd International Symposium, 2019

Improved Random Pattern Delay Fault Coverage Using Inversion Test Points.

[BibT_eX]

[DOI]

Proceedings of the 28th IEEE North Atlantic Test Workshop, 2019

Applying Neural Networks to Delay Fault Testing: Test Point Insertion and Random Circuit Training.

[BibT_eX]

[DOI]

Proceedings of the 28th IEEE Asian Test Symposium, 2019

2018

Modeling and test generation for combinational hardware Trojans.

[BibT_eX]

[DOI]

Ziqi Zhou

Ujjwal Guin

Proceedings of the 36th IEEE VLSI Test Symposium, 2018

2017

Three-Stage Optimization of Pre-Bond Diagnosis of TSV Defects.

[BibT_eX]

[DOI]

J. Electron. Test., 2017

Power-Aware Optimization of SoC Test Schedules Using Voltage and Frequency Scaling.

[BibT_eX]

[DOI]

J. Electron. Test., 2017

2016

Applications of Mixed-Signal Technology in Digital Testing.

[BibT_eX]

[DOI]

J. Electron. Test., 2016

Database Search and ATPG - Interdisciplinary Domains and Algorithms.

[BibT_eX]

[DOI]

Proceedings of the 29th International Conference on VLSI Design and 15th International Conference on Embedded Systems, 2016

Failures Guide Probabilistic Search for a Hard-to-Find Test.

[BibT_eX]

[DOI]

Proceedings of the 25th IEEE North Atlantic Test Workshop, 2016

2015

Defect Level Constrained Optimization of Analog and Radio Frequency Specification Tests.

[BibT_eX]

[DOI]

J. Electron. Test., 2015

A Maximum Power Algorithm to Find Frequencies for Aperiodic Clock Testing.

[BibT_eX]

[DOI]

Sindhu Gunasekar

J. Electron. Test., 2015

Diagnostic Tests for Pre-bond TSV Defects.

[BibT_eX]

[DOI]

Proceedings of the 28th International Conference on VLSI Design, 2015

Few Good Frequencies for Power-Constrained Test.

[BibT_eX]

[DOI]

Sindhu Gunasekar

Proceedings of the 28th International Conference on VLSI Design, 2015

SoC TAM Design to Minimize Test Application Time.

[BibT_eX]

[DOI]

Huiting Zhang

Proceedings of the 24th IEEE North Atlantic Test Workshop, 2015

Multivalued Logic for Reduced Pin Count and Multi-site SoC Testing.

[BibT_eX]

[DOI]

Proceedings of the 24th IEEE North Atlantic Test Workshop, 2015

Characterizing Processors for Energy and Performance Management.

[BibT_eX]

[DOI]

Harshit Goyal

Proceedings of the 16th International Workshop on Microprocessor and SOC Test and Verification, 2015

Adopting multi-valued logic for reduced pin-count testing.

[BibT_eX]

[DOI]

Letícia Maria Bolzani Pöhls

Proceedings of the 16th Latin-American Test Symposium, 2015

Message from the LATS2015 Chairs.

[BibT_eX]

[DOI]

Víctor H. Champac

Yervant Zorian

Proceedings of the 16th Latin-American Test Symposium, 2015

Quest for a quantum search algorithm for testing stuck-at faults in digital circuits.

[BibT_eX]

[DOI]

James J. Janaher

Proceedings of the 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2015

Securing IEEE 1687-2014 Standard Instrumentation Access by LFSR Key.

[BibT_eX]

[DOI]

Hejia Liu

Karthik Naishathrala Jayaraman

Proceedings of the 24th IEEE Asian Test Symposium, 2015

2014

A Four-Transistor Level Converter for Dual-Voltage Low-Power Design.

[BibT_eX]

[DOI]

J. Low Power Electron., 2014

Diagnostic Test Generation for Transition Delay Faults Using Stuck-At Fault Detection Tools.

[BibT_eX]

[DOI]

J. Electron. Test., 2014

A Novel Wafer Manipulation Method for Yield Improvement and Cost Reduction of 3D Wafer-on-Wafer Stacked ICs.

[BibT_eX]

[DOI]

J. Electron. Test., 2014

A Test Time Theorem and its Applications.

[BibT_eX]

[DOI]

J. Electron. Test., 2014

A New Test Vector Search Algorithm for a Single Stuck-at Fault Using Probabilistic Correlation.

[BibT_eX]

[DOI]

Proceedings of the IEEE 23rd North Atlantic Test Workshop, 2014

Optimal Selection of ATE Frequencies for Test Time Reduction Using Aperiodic Clock.

[BibT_eX]

[DOI]

Sindhu Gunasekar

Proceedings of the IEEE 23rd North Atlantic Test Workshop, 2014

Specification test minimization for given defect level.

[BibT_eX]

[DOI]

Proceedings of the 15th Latin American Test Workshop, 2014

An optimized diagnostic procedure for pre-bond TSV defects.

[BibT_eX]

[DOI]

Proceedings of the 32nd IEEE International Conference on Computer Design, 2014

2013

Energy-Efficient Dual-Voltage Design Using Topological Constraints.

[BibT_eX]

[DOI]

Mridula Allani

J. Low Power Electron., 2013

Neural Network Guided Spatial Fault Resilience in Array Processors.

[BibT_eX]

[DOI]

J. Electron. Test., 2013

Eliminating the Timing Penalty of Scan.

[BibT_eX]

[DOI]

Ozgur Sinanoglu

J. Electron. Test., 2013

Finding best voltage and frequency to shorten power-constrained test time.

[BibT_eX]

[DOI]

Proceedings of the 31st IEEE VLSI Test Symposium, 2013

Reducing Test Time of Power Constrained Test by Optimal Selection of Supply Voltage.

[BibT_eX]

[DOI]

Proceedings of the 26th International Conference on VLSI Design and 12th International Conference on Embedded Systems, 2013

Optimum Test Schedule for SoC with Specified Clock Frequencies and Supply Voltages.

[BibT_eX]

[DOI]

Proceedings of the 26th International Conference on VLSI Design and 12th International Conference on Embedded Systems, 2013

Power-aware SoC test optimization through dynamic voltage and frequency scaling.

[BibT_eX]

[DOI]

Proceedings of the 21st IEEE/IFIP International Conference on VLSI and System-on-Chip, 2013

Defect Diagnosis of Digital Circuits Using Surrogate Faults.

[BibT_eX]

[DOI]

Chidambaram Alagappan

Proceedings of the VLSI Design and Test, 17th International Symposium, 2013

ATE test time reduction using asynchronous clock period.

[BibT_eX]

[DOI]

Proceedings of the 2013 IEEE International Test Conference, 2013

High sensitivity test signatures for unconventional analog circuit test paradigms.

[BibT_eX]

[DOI]

Proceedings of the 2013 IEEE International Test Conference, 2013

Yield analysis of a novel wafer manipulation method in 3D stacking.

[BibT_eX]

[DOI]

Proceedings of the 2013 IEEE International 3D Systems Integration Conference (3DIC), 2013

2012

Parametric Fault Testing of Non-Linear Analog Circuits Based on Polynomial and V-Transform Coefficients.

[BibT_eX]

[DOI]

J. Electron. Test., 2012

Defect Level and Fault Coverage in Coefficient Based Analog Circuit Testing.

[BibT_eX]

[DOI]

J. Electron. Test., 2012

Diagnostic Test Set Minimization and Full-Response Fault Dictionary.

[BibT_eX]

[DOI]

Mohammed Ashfaq Shukoor

J. Electron. Test., 2012

Data-Driven DPPM Estimation and Adaptive Fault Coverage Calibration Using MATLAB®.

[BibT_eX]

[DOI]

Kanad Chakraborty

J. Electron. Test., 2012

Net diagnosis using stuck-at and transition fault models.

[BibT_eX]

[DOI]

Lixing Zhao

Proceedings of the 30th IEEE VLSI Test Symposium, 2012

Towards spatial fault resilience in array processors.

[BibT_eX]

[DOI]

Priyadharshini Shanmugasundaram

Proceedings of the 30th IEEE VLSI Test Symposium, 2012

Externally Tested Scan Circuit with Built-In Activity Monitor and Adaptive Test Clock.

[BibT_eX]

[DOI]

Proceedings of the 25th International Conference on VLSI Design, 2012

Keynote Talk: A History of the VLSI Design Conference.

[BibT_eX]

[DOI]

Proceedings of the 25th International Conference on VLSI Design, 2012

Power Problems in VLSI Circuit Testing.

[BibT_eX]

[DOI]

Farhana Rashid

Proceedings of the Progress in VLSI Design and Test - 16th International Symposium, 2012

Optimal power-constrained SoC test schedules with customizable clock rates.

[BibT_eX]

[DOI]

Proceedings of the IEEE 25th International SOC Conference, 2012

Retiming scan circuit to eliminate timing penalty.

[BibT_eX]

[DOI]

Ozgur Sinanoglu

Proceedings of the 13th Latin American Test Workshop, 2012

Impact of process variations on computers used for image processing.

[BibT_eX]

[DOI]

Proceedings of the 2012 IEEE International Symposium on Circuits and Systems, 2012

Tailoring Tests for Functional Binning of Integrated Circuits.

[BibT_eX]

[DOI]

Proceedings of the 21st IEEE Asian Test Symposium, 2012

2011

Ultra Low Energy CMOS Logic Using Below-Threshold Dual-Voltage Supply.

[BibT_eX]

[DOI]

Kyungseok Kim

J. Low Power Electron., 2011

Non-linear analog circuit test and diagnosis under process variation using V-Transform coefficients.

[BibT_eX]

[DOI]

Priyadharshini Shanmugasundaram

Proceedings of the 29th IEEE VLSI Test Symposium, 2011

Dynamic scan clock control for test time reduction maintaining peak power limit.

[BibT_eX]

[DOI]

Priyadharshini Shanmugasundaram

Proceedings of the 29th IEEE VLSI Test Symposium, 2011

An efficient test data reduction technique through dynamic pattern mixing across multiple fault models.

[BibT_eX]

[DOI]

Srinivasulu Alampally

R. T. Venkatesh

Rubin A. Parekhji

Proceedings of the 29th IEEE VLSI Test Symposium, 2011

True Minimum Energy Design Using Dual Below-Threshold Supply Voltages.

[BibT_eX]

[DOI]

Kyungseok Kim

Proceedings of the VLSI Design 2011: 24th International Conference on VLSI Design, 2011

Testing linear and non-linear analog circuits using moment generating functions.

[BibT_eX]

[DOI]

Proceedings of the 12th Latin American Test Workshop, 2011

Testing for faults, looking for defects.

[BibT_eX]

[DOI]

Proceedings of the 12th Latin American Test Workshop, 2011

Minimum energy CMOS design with dual subthreshold supply and multiple logic-level gates.

[BibT_eX]

[DOI]

Kyungseok Kim

Proceedings of the 12th International Symposium on Quality Electronic Design, 2011

Reduced complexity test generation algorithms for transition fault diagnosis.

[BibT_eX]

[DOI]

Proceedings of the IEEE 29th International Conference on Computer Design, 2011

Test and Diagnosis of Analog Circuits Using Moment Generating Functions.

[BibT_eX]

[DOI]

Proceedings of the 20th IEEE Asian Test Symposium, 2011

2010

Application of signal and noise theory to digital VLSI testing.

[BibT_eX]

[DOI]

Proceedings of the 28th IEEE VLSI Test Symposium, 2010

Parametric Fault Diagnosis of Nonlinear Analog Circuits Using Polynomial Coefficients.

[BibT_eX]

[DOI]

Proceedings of the VLSI Design 2010: 23rd International Conference on VLSI Design, 2010

An algorithm for diagnostic fault simulation.

[BibT_eX]

[DOI]

Proceedings of the 11th Latin American Test Workshop, 2010

A diagnostic test generation system.

[BibT_eX]

[DOI]

Proceedings of the 2011 IEEE International Test Conference, 2010

Soft error rate determination for nanoscale sequential logic.

[BibT_eX]

[DOI]

Fan Wang

Proceedings of the 11th International Symposium on Quality of Electronic Design (ISQED 2010), 2010

A diagnostic test generation system and a coverage metric.

[BibT_eX]

[DOI]

Proceedings of the 15th European Test Symposium, 2010

2009

Variable Input Delay CMOS Logic for Low Power Design.

[BibT_eX]

[DOI]

IEEE Trans. Very Large Scale Integr. Syst., 2009

Output Hazard-Free Transition Delay Fault Test Generation.

[BibT_eX]

[DOI]

Sreekumar Menon

Adit D. Singh

Proceedings of the 27th IEEE VLSI Test Symposium, 2009

Soft Error Rates with Inertial and Logical Masking.

[BibT_eX]

[DOI]

Fan Wang

Proceedings of the VLSI Design 2009: Improving Productivity through Higher Abstraction, 2009

Algorithms for Estimating Number of Glitches and Dynamic Power in CMOS Circuits with Delay Variations.

[BibT_eX]

[DOI]

Jins D. Alexander

Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2009

Designing Variation-tolerance in Mixed-signal Components of a System-on-chip.

[BibT_eX]

[DOI]

Wei Jiang

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2009), 2009

Polynomial coefficient based DC testing of non-linear analog circuits.

[BibT_eX]

[DOI]

Proceedings of the 19th ACM Great Lakes Symposium on VLSI 2009, 2009

On Minimization of Peak Power for Scan Circuit during Test.

[BibT_eX]

[DOI]

Proceedings of the 14th IEEE European Test Symposium, 2009

A Two Phase Approach for Minimal Diagnostic Test Set Generation.

[BibT_eX]

[DOI]

Mohammed Ashfaq Shukoor

Proceedings of the 14th IEEE European Test Symposium, 2009

Multi-tone Testing of Linear and Nonlinear Analog Circuits Using Polynomial Coefficients.

[BibT_eX]

[DOI]

Proceedings of the Eighteentgh Asian Test Symposium, 2009

2008

Fault Nodes in Implication Graph for Equivalence/Dominance Collapsing, and Identifying Untestable and Independent Faults.

[BibT_eX]

[DOI]

Rajamani Sethuram

Proceedings of the 26th IEEE VLSI Test Symposium (VTS 2008), April 27, 2008

Single Event Upset: An Embedded Tutorial.

[BibT_eX]

[DOI]

Fan Wang

Proceedings of the 21st International Conference on VLSI Design (VLSI Design 2008), 2008

Total Power Minimization in Glitch-Free CMOS Circuits Considering Process Variation.

[BibT_eX]

[DOI]

Proceedings of the 21st International Conference on VLSI Design (VLSI Design 2008), 2008

Built-in Self-Calibration of On-chip DAC and ADC.

[BibT_eX]

[DOI]

Wei Jiang

Proceedings of the 2008 IEEE International Test Conference, 2008

A tutorial on test power.

[BibT_eX]

[DOI]

Proceedings of the 2008 International Symposium on Low Power Electronics and Design, 2008

Sequential Circuit BIST Synthesis Using Spectrum and Noise from ATPG Patterns.

[BibT_eX]

[DOI]

Proceedings of the 17th IEEE Asian Test Symposium, 2008

2007

Graphical I<sub>DDQ</sub> Signatures Reduce Defect Level and Yield Loss.

[BibT_eX]

[DOI]

Lan Rao

IEEE Trans. Very Large Scale Integr. Syst., 2007

Delay Test Quality Evaluation Using Bounded Gate Delays.

[BibT_eX]

[DOI]

Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007

Spectral RTL Test Generation for Microprocessors.

[BibT_eX]

[DOI]

Proceedings of the 20th International Conference on VLSI Design (VLSI Design 2007), 2007

Statistical Leakage and Timing Optimization for Submicron Process Variation.

[BibT_eX]

[DOI]

Proceedings of the 20th International Conference on VLSI Design (VLSI Design 2007), 2007

A Reduced Complexity Algorithm for Minimizing N-Detect Tests.

[BibT_eX]

[DOI]

Kalyana R. Kantipudi

Proceedings of the 20th International Conference on VLSI Design (VLSI Design 2007), 2007

SPARTAN: a spectral and information theoretic approach to partial-scan.

[BibT_eX]

[DOI]

Omar I. Khan

Suresh Kumar Devanathan

Proceedings of the 2007 IEEE International Test Conference, 2007

Delay fault simulation with bounded gate delay mode.

[BibT_eX]

[DOI]

Hillary Grimes

Proceedings of the 2007 IEEE International Test Conference, 2007

Estimating stuck fault coverage in sequential logic using state traversal and entropy analysis.

[BibT_eX]

[DOI]

Proceedings of the 2007 IEEE International Test Conference, 2007

2006

Transistor Sizing of Logic Gates to Maximize Input Delay Variability.

[BibT_eX]

[DOI]

J. Low Power Electron., 2006

CMOS Leakage and Glitch Minimization for Power-Performance Tradeoff.

[BibT_eX]

[DOI]

J. Low Power Electron., 2006

Upper Bounding Fault Coverage by Structural Analysis and Signal Monitoring.

[BibT_eX]

[DOI]

Vijay Gangaram

Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

Fault Coverage Estimation for Non-Random Functional Input Sequences.

[BibT_eX]

[DOI]

Proceedings of the 2006 IEEE International Test Conference, 2006

Input-specific dynamic power optimization for VLSI circuits.

[BibT_eX]

[DOI]

Fei Hu

Proceedings of the 2006 International Symposium on Low Power Electronics and Design, 2006

Spectral RTL Test Generation for Gate-Level Stuck-at Faults.

[BibT_eX]

[DOI]

Proceedings of the 15th Asian Test Symposium, 2006

2005

Combinational automatic test pattern generation for acyclic sequential circuits.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2005

Using Contrapositive Law in an Implication Graph to Identify Logic Redundancies.

[BibT_eX]

[DOI]

Kunal K. Dave

Proceedings of the 18th International Conference on VLSI Design (VLSI Design 2005), 2005

Design of Variable Input Delay Gates for Low Dynamic Power Circuits.

[BibT_eX]

[DOI]

Proceedings of the Integrated Circuit and System Design, 2005

Leakage and Dynamic Glitch Power Minimization Using Integer Linear Programming for V<sub>th</sub> Assignment and Path Balancing.

[BibT_eX]

[DOI]

Proceedings of the Integrated Circuit and System Design, 2005

A random access scans architecture to reduce hardware overhead.

[BibT_eX]

[DOI]

Anand S. Mudlapur

Adit D. Singh

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

Enhanced Dual-Transition Probabilistic Power Estimation with Selective Supergate Analysis.

[BibT_eX]

[DOI]

Fei Hu

Proceedings of the 23rd International Conference on Computer Design (ICCD 2005), 2005

Dual-transition glitch filtering in probabilistic waveform power estimation.

[BibT_eX]

[DOI]

Fei Hu

Proceedings of the 15th ACM Great Lakes Symposium on VLSI 2005, 2005

Diagnostic and Detection Fault Collapsing for Multiple Output Circuits.

[BibT_eX]

[DOI]

Raja K. K. R. Sandireddy

Proceedings of the 2005 Design, 2005

Concurrent Test Generation.

[BibT_eX]

[DOI]

Alok S. Doshi

Proceedings of the 14th Asian Test Symposium (ATS 2005), 2005

2004

A New Classification of Path-Delay Fault Testability in Terms of Stuck-at Faults.

[BibT_eX]

[DOI]

Bhargab B. Bhattacharya

J. Comput. Sci. Technol., 2004

1985 to 1987: My years with D&T.

[BibT_eX]

[DOI]

IEEE Des. Test Comput., 2004

CMOS Circuit Design for Minimum Dynamic Power and Highest Speed.

[BibT_eX]

[DOI]

Proceedings of the 17th International Conference on VLSI Design (VLSI Design 2004), 2004

A Tuturial on the Emerging Nanotechnology Devices.

[BibT_eX]

[DOI]

Proceedings of the 17th International Conference on VLSI Design (VLSI Design 2004), 2004

On Random Pattern Generation with the Selfish Gene Algorithm for Testing Digital Sequential Circuits.

[BibT_eX]

[DOI]

Junwu Zhang

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2003

A test evaluation technique for VLSI circuits using register-transfer level fault modeling.

[BibT_eX]

[DOI]

Pradip A. Thaker

Mona E. Zaghloul

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2003

New Graphical IDDQ Signatures Reduce Defect Level and Yield Loss.

[BibT_eX]

[DOI]

Lan Rao

Proceedings of the 16th International Conference on VLSI Design (VLSI Design 2003), 2003

Minimum Dynamic Power CMOS Circuit Design by a Reduced Constraint Set Linear Program.

[BibT_eX]

[DOI]

Proceedings of the 16th International Conference on VLSI Design (VLSI Design 2003), 2003

A Fault-Independent Transitive Closure Algorithm for Redundancy Identification.

[BibT_eX]

[DOI]

Proceedings of the 16th International Conference on VLSI Design (VLSI Design 2003), 2003

Exclusive Test and its Applications to Fault Diagnosis.

[BibT_eX]

[DOI]

Proceedings of the 16th International Conference on VLSI Design (VLSI Design 2003), 2003

Fault Collapsing via Functional Dominance.

[BibT_eX]

[DOI]

A. V. S. S. Prasad

Madhusudan V. Atre

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

State and Fault Information for Compaction-Based Test Generation.

[BibT_eX]

[DOI]

J. Electron. Test., 2002

Multiple Faults: Modeling, Simulation and Test.

[BibT_eX]

[DOI]

Proceedings of the 7th Asia and South Pacific Design Automation Conference (ASP-DAC 2002), 2002

Electronic Testing for SOC Designers (Tutorial Abstract).

[BibT_eX]

[DOI]

Proceedings of the 7th Asia and South Pacific Design Automation Conference (ASP-DAC 2002), 2002

Analog Macromodeling of Capacitive Coupling Faults in Digital Circuit Interconnects.

[BibT_eX]

[DOI]

Aditya D. Sathe

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

A New Algorithm for Global Fault Collapsing into Equivalence and Dominance Sets.

[BibT_eX]

[DOI]

A. V. S. S. Prasad

Madhusudan V. Atre

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

A New Transitive Closure Algorithm with Application to Redundancy Identification.

[BibT_eX]

[DOI]

Vivek Gaur

Proceedings of the 1st IEEE International Workshop on Electronic Design, 2002

2001

Novel Spectral Methods for Built-In Self-Test in a System-on-a-Chip Environment.

[BibT_eX]

[DOI]

Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001

Combinational Test Generation for Acyclic SequentialCircuits using a Balanced ATPG Model.

[BibT_eX]

[DOI]

Proceedings of the 14th International Conference on VLSI Design (VLSI Design 2001), 2001

Combinational test generation for various classes of acyclic sequential circuits.

[BibT_eX]

[DOI]

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

Efficient spectral techniques for sequential ATPG.

[BibT_eX]

[DOI]

Proceedings of the Conference on Design, Automation and Test in Europe, 2001

2000

Improving path delay testability of sequential circuits.

[BibT_eX]

[DOI]

IEEE Trans. Very Large Scale Integr. Syst., 2000

Path delay fault simulation of sequential circuits.

[BibT_eX]

[DOI]

IEEE Trans. Very Large Scale Integr. Syst., 2000

False-Path Removal Using Delay Fault Simulation.

[BibT_eX]

[DOI]

J. Electron. Test., 2000

Choice of Tests for Logic Verification and Equivalence Checking.

[BibT_eX]

[DOI]

Proceedings of the 13th International Conference on VLSI Design (VLSI Design 2000), 2000

[BibT_eX]

[DOI]

Pradip A. Thaker

Mona E. Zaghloul

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

Reducing the Complexity of Defect Level Modeling Using the Clustering Effect.

[BibT_eX]

[DOI]

José T. de Sousa

Proceedings of the 2000 Design, 2000

Compaction-based test generation using state and fault information.

[BibT_eX]

[DOI]

Proceedings of the 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, 2000

Collaboration between Industry and Academia in Test Research.

[BibT_eX]

[DOI]

Proceedings of the 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, 2000

Testing in the Fourth Dimension.

[BibT_eX]

[DOI]

Proceedings of the 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, 2000

A testability metric for path delay faults and its application.

[BibT_eX]

[DOI]

Huan-Chih Tsai

Proceedings of ASP-DAC 2000, 2000

1999

Validation Vector Grade (VVG): A New Coverage Metric for Validation and Test.

[BibT_eX]

[DOI]

Pradip A. Thaker

Mona E. Zaghloul

Proceedings of the 17th IEEE VLSI Test Symposium (VTS '99), 1999

A Complete Characterization of Path Delay Faults through Stuck-at Faults.

[BibT_eX]

[DOI]

Bhargab B. Bhattacharya

Proceedings of the 12th International Conference on VLSI Design (VLSI Design 1999), 1999

A Test Generator for Segment Delay Faults.

[BibT_eX]

[DOI]

Proceedings of the 12th International Conference on VLSI Design (VLSI Design 1999), 1999

Digital Circuit Design for Minimum Transient Energy and a Linear Programming Method.

[BibT_eX]

[DOI]

Ganapathy Parthasarathy

Rajesh Ramadoss

Proceedings of the 12th International Conference on VLSI Design (VLSI Design 1999), 1999

Panel: Increasing test coverage in a VLSI desgin course.

[BibT_eX]

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

A Correlation Matrix Method of Clock Partitioning for Sequential Circuit Testability.

[BibT_eX]

[DOI]

Proceedings of the 9th Great Lakes Symposium on VLSI (GLS-VLSI '99), 1999

1998

A rated-clock test method for path delay faults.

[BibT_eX]

[DOI]

IEEE Trans. Very Large Scale Integr. Syst., 1998

A parallel-vector concurrent-fault simulator and generation of single-input-change tests for path-delay faults.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1998

The path-status graph with application to delay fault simulation.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1998

Deriving Logic Systems for Path Delay Test Generation.

[BibT_eX]

[DOI]

IEEE Trans. Computers, 1998

Numerical computation of characteristic polynomials of Boolean functions and its applications.

[BibT_eX]

[DOI]

David Lee

Henryk Wozniakowski

Numer. Algorithms, 1998

Design of mixed-signal systems for testability.

[BibT_eX]

[DOI]

Integr., 1998

Statistical Delay Fault Coverage Estimation for Synchronous Sequential Circuits.

[BibT_eX]

[DOI]

Lakshminarayana Pappu

J. Electron. Test., 1998

Editorial.

[BibT_eX]

[DOI]

Des. Autom. Embed. Syst., 1998

On Delay-Untestable Paths and Stuck-Fault Redundancy.

[BibT_eX]

[DOI]

Proceedings of the 16th IEEE VLSI Test Symposium (VTS '98), 28 April, 1998

Path Delay Testing: Variable-Clock Versus Rated-Clock.

[BibT_eX]

[DOI]

Proceedings of the 11th International Conference on VLSI Design (VLSI Design 1991), 1998

Tutorial: Delay Fault Models and Coverage.

[BibT_eX]

[DOI]

Ananta K. Majhi

Proceedings of the 11th International Conference on VLSI Design (VLSI Design 1991), 1998

Mixed-Signal Test.

[BibT_eX]

[DOI]

Ananta K. Majhi

Proceedings of the 11th International Conference on VLSI Design (VLSI Design 1991), 1998

Optimizing Logic Design Using Boolean Transforms.

[BibT_eX]

[DOI]

Pramit Chavda

Proceedings of the 11th International Conference on VLSI Design (VLSI Design 1991), 1998

A non-enumerative path delay fault simulator for sequential circuits.

[BibT_eX]

[DOI]

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

Mutually Disjoint Signals and Probability Calculation in Digital Circuits.

[BibT_eX]

[DOI]

Proceedings of the 8th Great Lakes Symposium on VLSI (GLS-VLSI '98), 1998

False-Path Removal Using Delay Fault Simulation.

[BibT_eX]

[DOI]

Proceedings of the 7th Asian Test Symposium (ATS '98), 2-4 December 1998, Singapore, 1998

1997

Scheduling tests for VLSI systems under power constraints.

[BibT_eX]

[DOI]

Richard M. Chou

IEEE Trans. Very Large Scale Integr. Syst., 1997

Improving a nonenumerative method to estimate path delay fault coverage.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1997

Redundancy removal and test generation for circuits with non-Boolean primitives.

[BibT_eX]

[DOI]

Steven G. Rothweiler

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1997

On variable clock methods for path delay testing of sequential circuits.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1997

Classification and Test Generation for Path-Delay Faults Using Single Struck-at Fault Tests.

[BibT_eX]

[DOI]

J. Electron. Test., 1997

Power Dissipation During Testing: Should We Worry About it?

[BibT_eX]

[DOI]

Hans-Joachim Wunderlich

Yervant Zorian

Proceedings of the 15th IEEE VLSI Test Symposium (VTS'97), 1997

Flags and Algebra for Sequential Circuit VNR Path Delay Fault Test Generation.

[BibT_eX]

[DOI]

Proceedings of the 10th International Conference on VLSI Design (VLSI Design 1997), 1997

Adder and Comparator Synthesis with Exclusive-OR Transform of Inputs.

[BibT_eX]

[DOI]

P. Srinivas Sivakumar

Proceedings of the 10th International Conference on VLSI Design (VLSI Design 1997), 1997

Low-Power Design by Hazard Filtering.

[BibT_eX]

[DOI]

Proceedings of the 10th International Conference on VLSI Design (VLSI Design 1997), 1997

Effective Path Selection for Delay Fault Testing of Sequential Circuits.

[BibT_eX]

[DOI]

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

Algorithms for Switch Level Delay Fault Simulation.

[BibT_eX]

[DOI]

Thomas G. Szymanski

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

Fast identification of untestable delay faults using implications.

[BibT_eX]

[DOI]

Proceedings of the 1997 IEEE/ACM International Conference on Computer-Aided Design, 1997

1996

Functional test generation for synchronous sequential circuits.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1996

1995 Asian Test Symposium carves a niche.

[BibT_eX]

IEEE Des. Test Comput., 1996

Segment delay faults: a new fault model.

[BibT_eX]

[DOI]

Proceedings of the 14th IEEE VLSI Test Symposium (VTS'96), April 28, 1996

Statistical path delay fault coverage estimation for synchronous sequential circuits.

[BibT_eX]

[DOI]

Lakshminarayana Pappu

Proceedings of the 9th International Conference on VLSI Design (VLSI Design 1996), 1996

On test coverage of path delay faults.

[BibT_eX]

[DOI]

Proceedings of the 9th International Conference on VLSI Design (VLSI Design 1996), 1996

Improving accuracy in path delay fault coverage estimation.

[BibT_eX]

[DOI]

Proceedings of the 9th International Conference on VLSI Design (VLSI Design 1996), 1996

Parallel concurrent path-delay fault simulation using single-input change patterns.

[BibT_eX]

[DOI]

Proceedings of the 9th International Conference on VLSI Design (VLSI Design 1996), 1996

Design for high-speed testability of stuck-at faults.

[BibT_eX]

[DOI]

Proceedings of the 9th International Conference on VLSI Design (VLSI Design 1996), 1996

Characteristic polynomial method for verification and test of combinational circuits.

[BibT_eX]

[DOI]

David Lee

Proceedings of the 9th International Conference on VLSI Design (VLSI Design 1996), 1996

Science, Technology, and the Indian Society.

[BibT_eX]

[DOI]

Proceedings of the 9th International Conference on VLSI Design (VLSI Design 1996), 1996

An Exact Non-Enumerative Fault Simulator for Path-Delay Faults.

[BibT_eX]

[DOI]

Proceedings of the Proceedings IEEE International Test Conference 1996, 1996

Synthesis of Self-Testing Finite State Machines from High-Level Specifications.

[BibT_eX]

[DOI]

Ronald D. Blanton

Maurizio Damiani

Proceedings of the Proceedings IEEE International Test Conference 1996, 1996

SIGMA: a simulator for segment delay faults.

[BibT_eX]

[DOI]

Proceedings of the 1996 IEEE/ACM International Conference on Computer-Aided Design, 1996

Improving Circuit Testability by Clock Control.

[BibT_eX]

[DOI]

Kent L. Einspahr

Proceedings of the 6th Great Lakes Symposium on VLSI (GLS-VLSI '96), 1996

Redundancy Identification Using Transitive Closure.

[BibT_eX]

[DOI]

Qing Lin

Proceedings of the 5th Asian Test Symposium (ATS '96), 1996

1995

A partition and resynthesis approach to testable design of large circuits.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1995

Test function embedding algorithms with application to interconnected finite state machines.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1995

Fault coverage estimation by test vector sampling.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1995

Energy models for delay testing.

[BibT_eX]

[DOI]

Mahesh A. Iyer

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1995

Combinational ATPG theorems for identifying untestable faults in sequential circuits.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1995

Test Generation for Path Delay Faults Using Binary Decision Diagrams.

[BibT_eX]

[DOI]

Debashis Bhattacharya

IEEE Trans. Computers, 1995

An exact algorithm for selecting partial scan flip-flops.

[BibT_eX]

[DOI]

Arun Balakrishnan

J. Electron. Test., 1995

Editorial - Special issue on partial scan design.

[BibT_eX]

[DOI]

J. Electron. Test., 1995

Simulation of at-speed tests for stuck-at faults.

[BibT_eX]

[DOI]

Proceedings of the 13th IEEE VLSI Test Symposium (VTS'95), April 30, 1995

Functional test generation for non-scan sequential circuits.

[BibT_eX]

[DOI]

Proceedings of the 8th International Conference on VLSI Design (VLSI Design 1995), 1995

An asynchronous algorithm for sequential circuit test generation on a network of workstations.

[BibT_eX]

[DOI]

Proceedings of the 8th International Conference on VLSI Design (VLSI Design 1995), 1995

An efficient automatic test generation system for path delay faults in combinational circuits.

[BibT_eX]

[DOI]

Proceedings of the 8th International Conference on VLSI Design (VLSI Design 1995), 1995

Statistical methods for delay fault coverage analysis.

[BibT_eX]

[DOI]

Proceedings of the 8th International Conference on VLSI Design (VLSI Design 1995), 1995

Robust testing for stuck-at faults.

[BibT_eX]

[DOI]

Proceedings of the 8th International Conference on VLSI Design (VLSI Design 1995), 1995

Classification and Test Generation for Path-Delay Faults Using Single Stuck-Fault Tests.

[BibT_eX]

[DOI]

Proceedings of the Proceedings IEEE International Test Conference 1995, 1995

High-Performance Circuit Testing with Slow-Speed Testers.

[BibT_eX]

[DOI]

Proceedings of the Proceedings IEEE International Test Conference 1995, 1995

An adaptive distributed algorithm for sequential circuit test generation.

[BibT_eX]

[DOI]

Proceedings of the Proceedings EURO-DAC'95, 1995

Functional test generation for path delay faults.

[BibT_eX]

[DOI]

Proceedings of the 4th Asian Test Symposium (ATS '95), 1995

Sequential logic path delay test generation by symbolic analysis.

[BibT_eX]

[DOI]

Proceedings of the 4th Asian Test Symposium (ATS '95), 1995

Panel: New Research Problems in the Emerging Test Technology.

[BibT_eX]

[DOI]

Parimal Pal Chaudhuri

Proceedings of the 4th Asian Test Symposium (ATS '95), 1995

1994

Energy minimization and design for testability.

[BibT_eX]

[DOI]

J. Electron. Test., 1994

A tale of two designs: the cheapest and the most economic.

[BibT_eX]

[DOI]

J. Electron. Test., 1994

FACTS: fault coverage estimation by test vector sampling.

[BibT_eX]

[DOI]

Proceedings of the 12th IEEE VLSI Test Symposium (VTS'94), 1994

An Improved Deductive Fault Simulator.

[BibT_eX]

[DOI]

P. R. Suresh Kumar

Proceedings of the Seventh International Conference on VLSI Design, 1994

A Test Function Architecture for Interconnected Finite State Machines.

[BibT_eX]

[DOI]

Proceedings of the Seventh International Conference on VLSI Design, 1994

Power Constraint Scheduling of Tests.

[BibT_eX]

[DOI]

Richard M. Chou

Proceedings of the Seventh International Conference on VLSI Design, 1994

Delay independent initialization of sequential circuits.

[BibT_eX]

[DOI]

Proceedings of the Fourth Great Lakes Symposium on Design Automation of High Performance VLSI Systems, 1994

An Efficient Path Delay Fault Coverage Estimator.

[BibT_eX]

[DOI]

Proceedings of the 31st Conference on Design Automation, 1994

Concurrent and comparative discrete event simulation.

[BibT_eX]

Ernst G. Ulrich

Jack H. Arabian

Kluwer, ISBN: 978-0-7923-9411-2, 1994

1993

Accurate computation of field reject ratio based on fault latency.

[BibT_eX]

[DOI]

D. Das

IEEE Trans. Very Large Scale Integr. Syst., 1993

Path delay fault simulation of sequential circuits.

[BibT_eX]

[DOI]

IEEE Trans. Very Large Scale Integr. Syst., 1993

A transitive closure algorithm for test generation.

[BibT_eX]

[DOI]

Steven G. Rothweiler

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1993

Finite state machine synthesis with fault tolerant test function.

[BibT_eX]

[DOI]

J. Electron. Test., 1993

The optimistic update theorem for path delay testing in sequential circuits.

[BibT_eX]

[DOI]

J. Electron. Test., 1993

A Tutorial on Built-In Self-Test, Part 2: Applications.

[BibT_eX]

[DOI]

Charles R. Kime

IEEE Des. Test Comput., 1993

A Tutorial on Built-in Self-Test. I. Principles.

[BibT_eX]

[DOI]

Charles R. Kime

IEEE Des. Test Comput., 1993

Generating Tests for Delay Faults in Nonscan Circuits.

[BibT_eX]

[DOI]

IEEE Des. Test Comput., 1993

Partial scan testing with single clock control.

[BibT_eX]

[DOI]

Proceedings of the 11th IEEE VLSI Test Symposium (VTS'93), 1993

A Path Delay Fault Simulator for Sequential Circuits.

[BibT_eX]

[DOI]

Proceedings of the Sixth International Conference on VLSI Design, 1993

A Synthesis Approach to Design for Testability.

[BibT_eX]

[DOI]

Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

Generation of Compact Delay Tests by Multiple-Path Activation.

[BibT_eX]

[DOI]

Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

Test Pattern Generation for Sequential Circuits on a Network of Workstations.

[BibT_eX]

[DOI]

Joan Villoldo

Proceedings of the Second International Symposium on High Performance Distributed Computing, 1993

Clock partitioning for testability.

[BibT_eX]

[DOI]

Kent L. Einspahr

Proceedings of the Third Great Lakes Symposium on Design Automation of High Performance VLSI Systems, 1993

Delay fault testability evaluation through timing simulation.

[BibT_eX]

[DOI]

Proceedings of the Third Great Lakes Symposium on Design Automation of High Performance VLSI Systems, 1993

Logic systems for path delay test generation.

[BibT_eX]

[DOI]

Proceedings of the European Design Automation Conference 1993, 1993

Design for Testability for Path Delay faults in Sequential Circuits.

[BibT_eX]

[DOI]

Proceedings of the 30th Design Automation Conference. Dallas, 1993

Sequential Circuit Test Generation on a Distributed System.

[BibT_eX]

[DOI]

Joan Villoldo

Proceedings of the 30th Design Automation Conference. Dallas, 1993

1992

Performance Analysis of Synchronized Iterative Algorithms on Multiprocessor Systems.

[BibT_eX]

[DOI]

IEEE Trans. Parallel Distributed Syst., 1992

Initializability Consideration in Sequential Machine Synthesis.

[BibT_eX]

[DOI]

IEEE Trans. Computers, 1992

The Comparative and Concurrent Simulation of discrete-event experiments.

[BibT_eX]

[DOI]

J. Electron. Test., 1992

Multiple fault detection in two-level multi-output circuits.

[BibT_eX]

[DOI]

J. Electron. Test., 1992

Functional Test Generation for Sequential Circuits.

[BibT_eX]

[DOI]

Proceedings of the Fifth International Conference on VLSI Design, 1992

A New Method for Generating Tests for Delay Faults in Non-Scan Circuits.

[BibT_eX]

[DOI]

Proceedings of the Fifth International Conference on VLSI Design, 1992

Finite State Machine Testing Based on Growth and Dissappearance Faults.

[BibT_eX]

[DOI]

Proceedings of the Digest of Papers: FTCS-22, 1992

DynaTAPP: dynamic timing analysis with partial path activation in sequential circuits.

[BibT_eX]

[DOI]

Proceedings of the conference on European design automation, 1992

Delay Fault Models and Test Generation for Random Logic Sequential Circuits.

[BibT_eX]

[DOI]

Proceedings of the 29th Design Automation Conference, 1992

Delay Fault Test Generation for Scan/Hold Circuits Using Boolean Expressions.

[BibT_eX]

[DOI]

Debashis Bhattacharya

Proceedings of the 29th Design Automation Conference, 1992

1991

Estimating the Quality of Manufactured Digital Sequential Circuits.

[BibT_eX]

[DOI]

Dharam Vir Das

Proceedings of the Proceedings IEEE International Test Conference 1991, 1991

Stafan Algorithms for MOS Circuits.

[BibT_eX]

[DOI]

Joan Villoldo

Proceedings of the Proceedings 1991 IEEE International Conference on Computer Design: VLSI in Computer & Processors, 1991

Design and Test-The Two Sides of a Coin.

[BibT_eX]

[DOI]

Proceedings of the Proceedings 1991 IEEE International Conference on Computer Design: VLSI in Computer & Processors, 1991

A Transitive Closure Based Algorithm for Test Generation.

[BibT_eX]

[DOI]

Proceedings of the 28th Design Automation Conference, 1991

1990

Toward massively parallel automatic test generation.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1990

A Statistical Theory of Digital Circuit Testability.

[BibT_eX]

[DOI]

Hassan Farhat

IEEE Trans. Computers, 1990

A Simulation-Based Method for Generating Tests for Sequential Circuits.

[BibT_eX]

[DOI]

Ernest S. Kuh

IEEE Trans. Computers, 1990

A Partial Scan Method for Sequential Circuits with Feedback.

[BibT_eX]

[DOI]

IEEE Trans. Computers, 1990

Finite state machine synthesis with embedded test function.

[BibT_eX]

[DOI]

J. Electron. Test., 1990

Neural Net and Boolean Satisfiability Models of Logic Circuits.

[BibT_eX]

[DOI]

IEEE Des. Test Comput., 1990

Fault Sampling Revisited.

[BibT_eX]

[DOI]

Hatsuyoshi Kato

IEEE Des. Test Comput., 1990

Performance estimation in a massively parallel system.

[BibT_eX]

[DOI]

Proceedings of the Proceedings Supercomputing '90, New York, NY, USA, November 12-16, 1990, 1990

An experimental study on reject ratio prediction for VLSI circuits: Kokomo revisited.

[BibT_eX]

[DOI]

Proceedings of the Proceedings IEEE International Test Conference 1990, 1990

Logic Simulation and Parallel Processing.

[BibT_eX]

[DOI]

Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 1990

Polynomial time solvable fault detection problems.

[BibT_eX]

[DOI]

Proceedings of the 20th International Symposium on Fault-Tolerant Computing, 1990

An architecture for synthesis of testable finite state machines.

[BibT_eX]

[DOI]

Proceedings of the European Design Automation Conference, 1990

An Entropy Measure for the Complexity of Multi-Output Boolean Functions.

[BibT_eX]

[DOI]

Proceedings of the 27th ACM/IEEE Design Automation Conference. Orlando, 1990

Automatic Test Generation Using Quadratic 0-1 Programming.

[BibT_eX]

[DOI]

Proceedings of the 27th ACM/IEEE Design Automation Conference. Orlando, 1990

Test Function Specification in Synthesis.

[BibT_eX]

[DOI]

Proceedings of the 27th ACM/IEEE Design Automation Conference. Orlando, 1990

1989

A directed search method for test generation using a concurrent simulator.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1989

A new model for computation of probabilistic testability in combinational circuits.

[BibT_eX]

[DOI]

Integr., 1989

Fault Simulation in a Pipelined Multiprocessor System.

[BibT_eX]

[DOI]

Proceedings of the Proceedings International Test Conference 1989, 1989

Design of sequential machines for efficient test generation.

[BibT_eX]

[DOI]

Proceedings of the 1989 IEEE International Conference on Computer-Aided Design, 1989

State assignment for initializable synthesis (gate level analysis).

[BibT_eX]

[DOI]

Proceedings of the 1989 IEEE International Conference on Computer-Aided Design, 1989

An economical scan design for sequential logic test generation.

[BibT_eX]

[DOI]

Proceedings of the Nineteenth International Symposium on Fault-Tolerant Computing, 1989

1988

Designing circuits with partial scan.

[BibT_eX]

[DOI]

IEEE Des. Test, 1988

Test generation by fault sampling.

[BibT_eX]

[DOI]

Hassan Farhat

Sharad Seth

Proceedings of the Computer Design: VLSI in Computers and Processors, 1988

Automatic test generation using neural networks.

[BibT_eX]

[DOI]

Proceedings of the 1988 IEEE International Conference on Computer-Aided Design, 1988

A sequential circuit test generation using threshold-value simulation.

[BibT_eX]

[DOI]

Ernest S. Kuh

Proceedings of the Eighteenth International Symposium on Fault-Tolerant Computing, 1988

Contest: A Concurrent Test Generator for Sequential Circuits.

[BibT_eX]

[DOI]

Proceedings of the 25th ACM/IEEE Conference on Design Automation, 1988

1986

Deterministic Versus Random Testing.

[BibT_eX]

M. Ray Mercer

Proceedings of the Proceedings International Test Conference 1986, 1986

1985

Modeling and Test Generation Algorithms for MOS Circuits.

[BibT_eX]

[DOI]

IEEE Trans. Computers, 1985

Statistical Fault Analysis.

[BibT_eX]

[DOI]

IEEE Des. Test, 1985

STAFAN Takes a Middle Course.

[BibT_eX]

Proceedings of the Proceedings International Test Conference 1985, 1985

Multiple output minimization.

[BibT_eX]

[DOI]

Nripendra N. Biswas

Proceedings of the 22nd ACM/IEEE conference on Design automation, 1985

VLSI design process.

[BibT_eX]

[DOI]

Samuel H. C. Poon

Proceedings of the 13th ACM Annual Conference on Computer Science, 1985

1984

Characterizing the LSI Yield Equation from Wafer Test Data.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1984

Will Testability Analysis Replace Fault Simulation ?

[BibT_eX]

Proceedings of the Proceedings International Test Conference 1984, 1984

A gate level model for CMOS combinational logic circuits with application to fault detection.

[BibT_eX]

[DOI]

Sudhakar M. Reddy

Proceedings of the 21st Design Automation Conference, 1984

STAFAN: An alternative to fault simulation.

[BibT_eX]

[DOI]

Proceedings of the 21st Design Automation Conference, 1984

Chip layout optimization using critical path weighting.

[BibT_eX]

[DOI]

Proceedings of the 21st Design Automation Conference, 1984

1983

Test generation for MOS circuits using D-algorithm.

[BibT_eX]

[DOI]

Proceedings of the 20th Design Automation Conference, 1983

1982

Testability Measures : What Do They Tell Us ?

[BibT_eX]

M. Ray Mercer

Proceedings of the Proceedings International Test Conference 1982, 1982

Synchronous path analysis in MOS circuit simulator.

[BibT_eX]

[DOI]

Proceedings of the 19th Design Automation Conference, 1982

1981

An Information Theoretic Approach to Digital Fault Testing.

[BibT_eX]

[DOI]

IEEE Trans. Computers, 1981

Test Generation for Highly Sequential Scan-Testable Circuits Through Logic Transformation.

[BibT_eX]

M. Ray Mercer

Carlos M. Roman

Proceedings of the Proceedings International Test Conference 1981, 1981

LSI product quality and fault coverage.

[BibT_eX]

[DOI]

Proceedings of the 18th Design Automation Conference, 1981

1980

A mixed-mode simulator.

[BibT_eX]

[DOI]

Proceedings of the 17th Design Automation Conference, 1980

1979

Author's Reply.

[BibT_eX]

[DOI]

IEEE Trans. Computers, 1979

Comments on "An Approach to Highly Integrated Computer-Maintained Cellular Arrays".

[BibT_eX]

[DOI]

IEEE Trans. Computers, 1979

1978

When to Use Random Testing.

[BibT_eX]

[DOI]

IEEE Trans. Computers, 1978

1976

On Monte Carlo Testing of Logic Tree Networks.

[BibT_eX]

[DOI]

IEEE Trans. Computers, 1976

1975

Probabilistic Analysis of Random Test Generation Method for Irredundant Combinational Logic Networks.

[BibT_eX]

[DOI]

IEEE Trans. Computers, 1975

1972

An Automatic Test Generation System for Illiac IV Logic Boards.

[BibT_eX]

[DOI]