Vishal Sharma

Orcid: 0000-0003-2618-0655

Affiliations:
  • Indian Institute of Technology Indore, VLSI Circuit and System Design Lab, India


According to our database1, Vishal Sharma authored at least 11 papers between 2018 and 2024.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Bibliography

2024
A 1-Mb RRAM Macro With 9.8 ns Read Access Time Utilizing Dynamic Reference Voltage for Reliable Sensing Operation.
IEEE Trans. Circuits Syst. II Express Briefs, May, 2024

In-Memory Computing with 6T SRAM for Multi-operator Logic Design.
Circuits Syst. Signal Process., January, 2024

2023
Designing a Performance-Centric MAC Unit with Pipelined Architecture for DNN Accelerators.
Circuits Syst. Signal Process., October, 2023

A 400MHz 249.1TOPS/W 64Kb Fully-Reconfigurable SRAM-Based Digital Compute-in-Memory Macro for Accelerating CNNs.
Proceedings of the IEEE Asian Solid-State Circuits Conference, 2023

2022
A 64 Kb Reconfigurable Full-Precision Digital ReRAM-Based Compute-In-Memory for Artificial Intelligence Applications.
IEEE Trans. Circuits Syst. I Regul. Pap., 2022

A Reconfigurable 16Kb AND8T SRAM Macro With Improved Linearity for Multibit Compute-In Memory of Artificial Intelligence Edge Devices.
IEEE J. Emerg. Sel. Topics Circuits Syst., 2022

2021
AND8T SRAM Macro with Improved Linearity for Multi-Bit In-Memory Computing.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2021

2020
A 2.4-GS/s Power-Efficient, High-Resolution Reconfigurable Dynamic Comparator for ADC Architecture.
Circuits Syst. Signal Process., 2020

ReRAM Device and Circuit Co-Design Challenges in Nano-scale CMOS Technology.
Proceedings of the 2020 IEEE Asia Pacific Conference on Circuits and Systems, 2020

2018
A write-improved low-power 12T SRAM cell for wearable wireless sensor nodes.
Int. J. Circuit Theory Appl., 2018

A Write-Improved Half-Select-Free Low-Power 11T Subthreshold SRAM with Double Adjacent Error Correction for FPGA-LUT Design.
Proceedings of the VLSI Design and Test - 22nd International Symposium, 2018


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