Vishal Khatri

According to our database, Vishal Khatri authored at least 8 papers between 2010 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2022

Prediction of Compressive Strength of Green Concrete by Artificial Neural Network.

Manvendra Verma, Kamal Upreti, Priyanka Dadhich, Soumi Ghosh, Vishal Khatri, Prashant Singh

Proceedings of the Advanced Communication and Intelligent Systems, 2022

2021

An 8b DAC-Based SST TX Using Metal Gate Resistors with 1.4pJ/b Efficiency at 112Gb/s PAM-4 and 8-Tap FFE in 7iim CMOS.

Marcel A. Kossel, Vishal Khatri, Matthias Braendli, Pier Andrea Francese, Thomas Morf, Serdar A. Yonar, Mridula Prathapan, Eric J. Lukes, Raymond A. Richetta, Carrie Cox

Proceedings of the IEEE International Solid-State Circuits Conference, 2021

2019

A 19.3-24.8 GHz Dual-Slope VCO in 65-nm CMOS for Automotive Radar Applications.

Vipul Jain, Saurabh Kumar Gupta, Vishal Khatri, Gaurab Banerjee

Proceedings of the 32nd International Conference on VLSI Design and 18th International Conference on Embedded Systems, 2019

2017

A 0.1-2-GHz Quadrature Correction Loop for Digital Multiphase Clock Generation Circuits in 130-nm CMOS.

Immanuel Raja, Vishal Khatri, Zaira Zahir, Gaurab Banerjee

IEEE Trans. Very Large Scale Integr. Syst., 2017

2016

A 0.25-3.25-GHz Wideband CMOS-RF Spectrum Sensor for Narrowband Energy Detection.

Vishal Khatri, Gaurab Banerjee

IEEE Trans. Very Large Scale Integr. Syst., 2016

A Wide-Band Receiver Front-End with Programmable Frequency Selective Input Matching.

Manas Kumar Lenka, Akash Agrawal, Vishal Khatri, Gaurab Banerjee

Proceedings of the 29th International Conference on VLSI Design and 15th International Conference on Embedded Systems, 2016

2015

A Mitigation Technique for Harmonic Downconversion in Wideband Spectrum Sensors.

Vishal Khatri, Gaurab Banerjee

IEEE Trans. Instrum. Meas., 2015

2010

DFM aware bridge pair extraction for manufacturing test development.

Sarveswara Tammali, Vishal Khatri, Gowrysankar Shanmugam, Mark Terry

Proceedings of the 2011 IEEE International Test Conference, 2010