Virginia H. Brecher

According to our database, Virginia H. Brecher authored at least 4 papers between 1988 and 1997.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

1997

Automatic defect classification for semiconductor manufacturing.

Paul B. Chou, A. Ravishankar Rao, Martin C. Sturzenbecker, Frederick Y. Wu, Virginia H. Brecher

Mach. Vis. Appl., 1997

1995

Recent advances in the automatic inspection of integrated circuits for pattern defects.

Byron Dom, Virginia H. Brecher

Mach. Vis. Appl., 1995

1988

The P300: A system for automatic patterned wafer inspection.

Byron Dom, Virginia H. Brecher, Raymond Bonner, John S. Batchelder, Robert S. Jaffe

Mach. Vis. Appl., 1988

Errata.

Byron Dom, Virginia H. Brecher, Raymond Bonner, John S. Batchelder, Robert S. Jaffe

Mach. Vis. Appl., 1988