Viorel Banu

According to our database, Viorel Banu authored at least 9 papers between 2008 and 2016.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2016

Power cycling analysis method for high-voltage SiC diodes.

Viorel Banu, Victor Soler, Josep Montserrat, José Millán, Philippe Godignon

Microelectron. Reliab., 2016

2015

SiC Integrated Circuit Control Electronics for High-Temperature Operation.

Mihaela Alexandru, Viorel Banu, Xavier Jordà, Josep Montserrat, Miquel Vellvehí, Dominique Tournier, José Millán, Philippe Godignon

IEEE Trans. Ind. Electron., 2015

2014

Temperature effects on the ruggedness of SiC Schottky diodes under surge current.

Javier Leon, Xavier Perpiñà, Viorel Banu, Josep Montserrat, Maxime Berthou, Miquel Vellvehí, Philippe Godignon, Xavier Jordà

Microelectron. Reliab., 2014

2013

4H-SiC MESFET specially designed and fabricated for high temperature integrated circuits.

Mihaela Alexandru, Viorel Banu, Philippe Godignon, Miquel Vellvehí, José Millán

Proceedings of the European Solid-State Device Research Conference, 2013

High temperature-low temperature coefficient analog voltage reference integrated circuit implemented with SiC MESFETs.

Viorel Banu, Philippe Godignon, Mihaela Alexandru, Miquel Vellvehí, Xavier Jordà, José Millán

Proceedings of the ESSCIRC 2013, 2013

2012

Thermal cycling analysis of high temperature die-attach materials.

Luis A. Navarro, Xavier Perpiñà, Miquel Vellvehí, Viorel Banu, Xavier Jordà

Microelectron. Reliab., 2012

Enhanced power cycling capability of SiC Schottky diodes using press pack contacts.

Viorel Banu, Philippe Godignon, Xavier Perpiñà, Xavier Jordà, José Millán

Microelectron. Reliab., 2012

2011

SiC Schottky Diodes for Harsh Environment Space Applications.

Philippe Godignon, Xavier Jordà, Miquel Vellvehí, Xavier Perpiñà, Viorel Banu, Demetrio López, Juan Barbero, Pierre Brosselard, Silvia Massetti

IEEE Trans. Ind. Electron., 2011

2008

Behaviour of 1.2 kV SiC JBS diodes under repetitive high power stress.

Viorel Banu, Pierre Brosselard, Xavier Jordà, Josep Montserrat, Philippe Godignon, José Millán

Microelectron. Reliab., 2008