Vincent Gouin

According to our database, Vincent Gouin authored at least 4 papers between 2007 and 2009.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2009

A new design-for-test technique for SRAM core-cell stability faults.

Alexandre Ney, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin

Proceedings of the Design, Automation and Test in Europe, 2009

2008

An SRAM Design-for-Diagnosis Solution Based on Write Driver Voltage Sensing.

Alexandre Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin

Proceedings of the 26th IEEE VLSI Test Symposium (VTS 2008), April 27, 2008

A Design-for-Diagnosis Technique for SRAM Write Drivers.

Alexandre Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin

Proceedings of the Design, Automation and Test in Europe, 2008

2007

Influence of Threshold Voltage Deviations on 90nm SRAM Core-Cell Behavior.

Magali Bastian, Vincent Gouin, Patrick Girard, Christian Landrault, Alexandre Ney, Serge Pravossoudovitch, Arnaud Virazel

Proceedings of the 16th Asian Test Symposium, 2007