Vincent Goiffon
Orcid: 0000-0001-5024-0115
According to our database1,
Vincent Goiffon
authored at least 12 papers
between 2015 and 2024.
Collaborative distances:
Collaborative distances:
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Bibliography
2024
Radiation Damage on Silicon Photomultipliers from Ionizing and Non-Ionizing Radiation of Low-Earth Orbit Operations.
Sensors, August, 2024
Design Techniques Evaluation to Mitigate RTS Noise Effect in Column ADC of 3D Stacked Image Sensors.
Proceedings of the IEEE International Reliability Physics Symposium, 2024
2023
Development of a Charge-Multiplication CMOS Image Sensor Based on Capacitive Trench for Low-Light-Level Imaging.
Sensors, December, 2023
Evaluation of Microlenses, Color Filters, and Polarizing Filters in CIS for Space Applications.
Sensors, July, 2023
Quantum efficiency of backside-illuminated pixels under ultraviolet illumination: ARC coatings impact measurements and simulations.
Proceedings of the Imaging Sensors and Systems 2023, 2023
2022
Automatic Detection and Correction of Random Telegraph Signal Artifacts in Earth Observation Images.
IEEE Geosci. Remote. Sens. Lett., 2022
2019
CMOS Image Sensors and Plasma Processes: How PMD Nitride Charging Acts on the Dark Current.
Sensors, 2019
Leakage Current Non-Uniformity and Random Telegraph Signals in CMOS Image Sensor Floating Diffusions Used for In-Pixel Charge Storage.
Sensors, 2019
Random Telegraph Noises from the Source Follower, the Photodiode Dark Current, and the Gate-Induced Sense Node Leakage in CMOS Image Sensors.
Sensors, 2019
Proceedings of the IEEE International Reliability Physics Symposium, 2019
2018
Proceedings of the Image Sensors and Imaging Systems 2018, 2018
2015
Charge transfer speed analysis in pinned photodiode CMOS image sensors based on a pulsed storage-gate method.
Proceedings of the 45th European Solid State Device Research Conference, 2015