Victor Moroz

According to our database, Victor Moroz authored at least 12 papers between 1998 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

3DIC System-Technology Co-Optimization with a Focus on the Interplay of Thermal, Power, Timing, and Stress Effects.

Victor Moroz, Xiaopeng Xu, Alexei Svizhenko, Xi-Wei Lin, Sergey Popov, Henry Sheng, Kenneth Larsen

Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024

2023

Exploring Power Savings of Gate-All-Around Cryogenic Technology.

Victor Moroz, Alexei Svizhenko, Munkang Choi, Plamen Asenov, Jaehyun Lee

Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023

Gate-All-Around Technology is Coming.: What's Next After GAA?

Victor Moroz

Proceedings of the 2023 International Symposium on Physical Design, 2023

2018

TCAD modeling for reliability.

Paul Pfäffli, Hiu Yung Wong, X. Xu, Luca Silvestri, X. W. Lin, T. Yang, Ravi Tiwari, Souvik Mahapatra, Steve Motzny, Victor Moroz, Terry Ma

Microelectron. Reliab., 2018

2016

Transistor design for 5nm and beyond: Slowing down electrons to speed up transistors.

Victor Moroz, Joanne Huang, Reza Arghavani

Proceedings of the 17th International Symposium on Quality Electronic Design, 2016

Technology Inflection Points.

Victor Moroz

Proceedings of the 2016 on International Symposium on Physical Design, 2016

A CMOS-compatible boosted transistor having >2× drive current and low leakage current.

Jin-Woo Han, Victor Moroz, Andrey Kucherov, Dinesh Maheshwari, Valentin Abramzon, Zvi Or-Bach, Yoshio Nishi, Yuniarto Widjaja

Proceedings of the 46th European Solid-State Device Research Conference, 2016

2010

Layout Proximity Effects and Modeling Alternatives for IC Designs.

Xi-Wei Lin, Victor Moroz

IEEE Des. Test Comput., 2010

2009

Analysis of performance and reliability trade-off in dummy pattern design for 32-nm technology.

Aditya P. Karmarkar, Xiaopeng Xu, Victor Moroz, Greg Rollins, Xiao Lin

Proceedings of the 10th International Symposium on Quality of Electronic Design (ISQED 2009), 2009

2006

Bringing Manufacturing into Design via Process-Dependent SPICE Models.

Sridhar Tirumala, Yuri Mahotin, Xiao Lin, Victor Moroz, Lee Smith, S. Krishnamurthy, L. Bomholt, Dipu Pramanik

Proceedings of the 7th International Symposium on Quality of Electronic Design (ISQED 2006), 2006

Stress-Aware Design Methodology.

Victor Moroz, Lee Smith, Xi-Wei Lin, Dipu Pramanik, Greg Rollins

Proceedings of the 7th International Symposium on Quality of Electronic Design (ISQED 2006), 2006

1998

A Hybrid Mesh Generation Method for Two and Three Dimensional Simulation of Semiconductor Processes and Devices.

Dan Wake, Klas Lilja, Victor Moroz

Proceedings of the 7th International Meshing Roundtable, 1998