Victor M. van Santen

According to our database, Victor M. van Santen authored at least 34 papers between 2014 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2024

Graph Attention Networks to Identify the Impact of Transistor Degradation on Circuit Reliability.

Tarek Mohamed, Victor M. van Santen, Lilas Alrahis, Ozgur Sinanoglu, Hussam Amrouch

IEEE Trans. Circuits Syst. I Regul. Pap., July, 2024

Technology Mapping for Cryogenic CMOS Circuits.

Benjamin Hien, Marcel Walter, Victor M. van Santen, Florian Klemme, Shivendra Singh Parihar, Girish Pahwa, Yogesh Singh Chauhan, Hussam Amrouch, Robert Wille

Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2024

Machine Learning Unleashes Aging and Self-Heating Effects: From Transistors to Full Processor (Invited Paper).

Hussam Amrouch, Victor M. van Santen, Javier Diaz-Fortuny, Florian Klemme

Proceedings of the IEEE International Reliability Physics Symposium, 2024

2023

Performance and Energy Studies on NC-FinFET Cache-Based Systems With FN-McPAT.

Divya Praneetha Ravipati, Victor M. van Santen, Sami Salamin, Hussam Amrouch, Preeti Ranjan Panda

IEEE Trans. Very Large Scale Integr. Syst., September, 2023

Massively Parallel Circuit Setup in GPU-SPICE.

Victor M. van Santen, Fu Lam Florian Diep, Jörg Henkel, Hussam Amrouch

IEEE Trans. Computers, August, 2023

Degradation Models and Optimizations for CMOS Circuits

Victor M. van Santen

PhD thesis, 2023

Cryogenic CMOS for Quantum Processing: 5-nm FinFET-Based SRAM Arrays at 10 K.

Shivendra Singh Parihar, Victor M. van Santen, Simon Thomann, Girish Pahwa, Yogesh Singh Chauhan, Hussam Amrouch

IEEE Trans. Circuits Syst. I Regul. Pap., 2023

Characterizing BTI and HCD in 1.2V 65nm CMOS Oscillators made from Combinational Standard Cells and Processor Logic Paths.

Victor M. van Santen, Jose M. Gata-Romero, Juan Núñez, Rafael Castro-López, Elisenda Roca, Hussam Amrouch

Proceedings of the IEEE International Reliability Physics Symposium, 2023

Challenges in Machine Learning Techniques to Estimate Reliability from Transistors to Circuits.

Victor M. van Santen, Florian Klemme, Paul R. Genssler, Hussam Amrouch

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2023

Design Automation for Cryogenic CMOS Circuits.

Victor M. van Santen, Marcel Walter, Florian Klemme, Shivendra Singh Parihar, Girish Pahwa, Yogesh Singh Chauhan, Robert Wille, Hussam Amrouch

Proceedings of the 60th ACM/IEEE Design Automation Conference, 2023

2022

FN-CACTI: Advanced CACTI for FinFET and NC-FinFET Technologies.

Divya Praneetha Ravipati, Rajesh Kedia, Victor M. van Santen, Jörg Henkel, Preeti Ranjan Panda, Hussam Amrouch

IEEE Trans. Very Large Scale Integr. Syst., 2022

On the Reliability of FeFET On-Chip Memory.

Paul R. Genssler, Victor M. van Santen, Jörg Henkel, Hussam Amrouch

IEEE Trans. Computers, 2022

2021

Minimizing Excess Timing Guard Banding Under Transistor Self-Heating Through Biasing at Zero-Temperature Coefficient.

Sami Salamin, Victor M. van Santen, Martin Rapp, Jörg Henkel, Hussam Amrouch

IEEE Access, 2021

Reliability-Driven Voltage Optimization for NCFET-based SRAM Memory Banks.

Victor M. van Santen, Simon Thomann, Yogesh S. Chauchan, Jörg Henkel, Hussam Amrouch

Proceedings of the 39th IEEE VLSI Test Symposium, 2021

Special Session: Machine Learning for Semiconductor Test and Reliability.

Hussam Amrouch, Animesh Basak Chowdhury, Wentian Jin, Ramesh Karri, Farshad Khorrami, Prashanth Krishnamurthy, Ilia Polian, Victor M. van Santen, Benjamin Tan, Sheldon X.-D. Tan

Proceedings of the 39th IEEE VLSI Test Symposium, 2021

Self-Heating Effects from Transistors to Gates.

Victor M. van Santen, Linda Schillinger, Hussam Amrouch

Proceedings of the International Symposium on VLSI Design, Automation and Test, 2021

2020

On the Workload Dependence of Self-Heating in FinFET Circuits.

Victor M. van Santen, Hussam Amrouch, Pooja Kumari, Jörg Henkel

IEEE Trans. Circuits Syst. II Express Briefs, 2020

BTI and HCD Degradation in a Complete 32 × 64 bit SRAM Array - including Sense Amplifiers and Write Drivers - under Processor Activity.

Victor M. van Santen, Simon Thomann, Chaitanya Pasupuleti, Paul R. Genssler, Narendra Gangwar, Uma Sharma, Jörg Henkel, Souvik Mahapatra, Hussam Amrouch

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Modeling Emerging Technologies using Machine Learning: Challenges and Opportunities.

Florian Klemme, Jannik Prinz, Victor M. van Santen, Jörg Henkel, Hussam Amrouch

Proceedings of the IEEE/ACM International Conference On Computer Aided Design, 2020

Impact of Self-Heating on Performance, Power and Reliability in FinFET Technology.

Victor M. van Santen, Paul R. Genssler, Om Prakash, Simon Thomann, Jörg Henkel, Hussam Amrouch

Proceedings of the 25th Asia and South Pacific Design Automation Conference, 2020

NCFET to Rescue Technology Scaling: Opportunities and Challenges.

Hussam Amrouch, Victor M. van Santen, Girish Pahwa, Yogesh Singh Chauhan, Jörg Henkel

Proceedings of the 25th Asia and South Pacific Design Automation Conference, 2020

2019

Modeling the Interdependences Between Voltage Fluctuation and BTI Aging.

Sami Salamin, Victor M. van Santen, Hussam Amrouch, Narendra Parihar, Souvik Mahapatra, Jörg Henkel

IEEE Trans. Very Large Scale Integr. Syst., 2019

Modeling and Evaluating the Gate Length Dependence of BTI.

Victor M. van Santen, Hussam Amrouch, Jörg Henkel

IEEE Trans. Circuits Syst. II Express Briefs, 2019

Modeling and Mitigating Time-Dependent Variability From the Physical Level to the Circuit Level.

Victor M. van Santen, Hussam Amrouch, Jörg Henkel

IEEE Trans. Circuits Syst. I Regul. Pap., 2019

Reliability Challenges with Self-Heating and Aging in FinFET Technology.

Hussam Amrouch, Victor M. van Santen, Om Prakash, Hammam Kattan, Sami Salamin, Simon Thomann, Jörg Henkel

Proceedings of the 25th IEEE International Symposium on On-Line Testing and Robust System Design, 2019

2018

Reliability in Super- and Near-Threshold Computing: A Unified Model of RTN, BTI, and PV.

Victor M. van Santen, Javier Martín-Martínez, Hussam Amrouch, Montserrat Nafría, Jörg Henkel

IEEE Trans. Circuits Syst. I Regul. Pap., 2018

Weighted time lag plot defect parameter extraction and GPU-based BTI modeling for BTI variability.

Victor M. van Santen, Javier Diaz-Fortuny, Hussam Amrouch, Javier Martín-Martínez, Rosana Rodríguez, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández, Jörg Henkel, Montserrat Nafría

Proceedings of the IEEE International Reliability Physics Symposium, 2018

Reliability Estimations of Large Circuits in Massively-Parallel GPU-SPICE.

Victor M. van Santen, Hussam Amrouch, Jörg Henkel

Proceedings of the 24th IEEE International Symposium on On-Line Testing And Robust System Design, 2018

Estimating and optimizing BTI aging effects: from physics to CAD.

Hussam Amrouch, Victor M. van Santen, Jörg Henkel

Proceedings of the International Conference on Computer-Aided Design, 2018

2017

Interdependencies of Degradation Effects and Their Impact on Computing.

Hussam Amrouch, Victor M. van Santen, Jörg Henkel

IEEE Des. Test, 2017

2016

Aging-aware voltage scaling.

Victor M. van Santen, Hussam Amrouch, Narendra Parihar, Souvik Mahapatra, Jörg Henkel

Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition, 2016

Designing guardbands for instantaneous aging effects.

Victor M. van Santen, Hussam Amrouch, Javier Martín-Martínez, Montserrat Nafría, Jörg Henkel

Proceedings of the 53rd Annual Design Automation Conference, 2016

2015

Connecting the physical and application level towards grasping aging effects.

Hussam Amrouch, Javier Martín-Martínez, Victor M. van Santen, Miquel Moras, Rosana Rodríguez, Montserrat Nafría, Jörg Henkel

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2014

Towards interdependencies of aging mechanisms.

Hussam Amrouch, Victor M. van Santen, Thomas Ebi, Volker Wenzel, Jörg Henkel

Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 2014