Varadan Savulimedu Veeravalli

According to our database1, Varadan Savulimedu Veeravalli authored at least 15 papers between 2012 and 2017.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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Bibliography

2017
A versatile architecture for long-term monitoring of single-event transient durations.
Microprocess. Microsystems, 2017

Setup for an Experimental Study of Radiation Effects in 65nm CMOS.
Proceedings of the Euromicro Conference on Digital System Design, 2017

A Critical Charge Model for Estimating the SET and SEU Sensitivity: A Muller C-Element Case Study.
Proceedings of the 26th IEEE Asian Test Symposium, 2017

2016
Study of a delayed single-event effect in the Muller C-element.
Proceedings of the 21th IEEE European Test Symposium, 2016

Design and Physical Implementation of a Target ASIC for SET Experiments.
Proceedings of the 2016 Euromicro Conference on Digital System Design, 2016

2015
Building reliable systems-on-chip in nanoscale technologies.
Elektrotech. Informationstechnik, 2015

Reliable and Continuous Measurement of SET Pulse Widths.
Proceedings of the 2015 Euromicro Conference on Digital System Design, 2015

2014
Measuring SET pulsewidths in logic gates using digital infrastructure.
Proceedings of the Fifteenth International Symposium on Quality Electronic Design, 2014

Architecture for monitoring SET propagation in 16-bit Sklansky adder.
Proceedings of the Fifteenth International Symposium on Quality Electronic Design, 2014

Exploring the state dependent SET sensitivity of asynchronous logic - The muller-pipeline example.
Proceedings of the 32nd IEEE International Conference on Computer Design, 2014

2013
An infrastructure for accurate characterization of single-event transients in digital circuits.
Microprocess. Microsystems, 2013

Modular Redundancy in a GALS System Using Asynchronous Recovery Links.
Proceedings of the 19th IEEE International Symposium on Asynchronous Circuits and Systems, 2013

2012
Architecture and Design Analysis of a Digital Single-Event Transient/Upset Measurement Chip.
Proceedings of the 15th Euromicro Conference on Digital System Design, 2012

Protecting an Asynchronous NoC against Transient Channel Faults.
Proceedings of the 15th Euromicro Conference on Digital System Design, 2012

Radiation-tolerant combinational gates - an implementation based comparison.
Proceedings of the IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2012


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