Valter Laino

According to our database, Valter Laino authored at least 8 papers between 2023 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2024

Design and Characterization of a Powered Wheelchair Autonomous Guidance System.

Vincenzo Gallo, Irida Shallari, Marco Carratù, Valter Laino, Consolatina Liguori

Sensors, March, 2024

Propagation of Measurement Uncertainty in IMU Orientation Tracking Algorithms.

Daniele Buonocore, Marco Carratù, Vincenzo Gallo, Valter Laino, Antonio Pietrosanto, Paolo Sommella

Proceedings of the IEEE International Workshop on Metrology for Industry 4.0 and IoT, 2024

Earthquake Magnitude Estimation with Single Seismic Station using Deep Learning.

Marco Carratù, Vincenzo Gallo, Valter Laino, Vincenzo Paciello, António Espírito-Santo, Irida Shallari

Proceedings of the 2024 IEEE International Symposium on Measurements & Networking (M&N), 2024

Accuracy Impact of Increased Measurement Quality when using Pretrained Networks for Classification.

Jan Lundgren, Meng Jiang, Valter Laino, Vincenzo Gallo, Marco Carratù, Chibuzo Joseph Nnonyelu

Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2024

Cross-Correlation Estimation in Artificial Neural Network for Uncertainty Assessment.

Marco Carratù, Vincenzo Gallo, Valter Laino, Consolatina Liguori, Antonio Pietrosanto, Jan Lundgren

Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2024

Including Measurement Uncertainty to Improve the Reliability of Classification ANN.

Marco Carratù, Vincenzo Gallo, Valter Laino, Consolatina Liguori, Antonio Pietrosanto

Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2024

2023

A Survey on Uncertainty Assessment in ANN-Based Measurements.

Marco Carratù, Vincenzo Gallo, Valter Laino, Consolatina Liguori, Antonio Pietrosanto

Proceedings of the IEEE International Conference on Metrology for eXtended Reality, 2023

The Evaluation of Uncertainty in Measurements Using Artificial Neural Network Techniques.

Marco Carratù, Vincenzo Gallo, Valter Laino, Consolatina Liguori, Vincenzo Paciello, Antonio Pietrosanto

Proceedings of the 49th Annual Conference of the IEEE Industrial Electronics Society, 2023