Valerij V. Saposhnikov

According to our database, Valerij V. Saposhnikov authored at least 11 papers between 1996 and 2004.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2004

Necessary and Sufficient Conditions for the Existence of Totally Self-Checking Circuits.

Valerij V. Saposhnikov, Vladimir V. Saposhnikov, Andrej A. Morosov, Michael Gössel

Proceedings of the 10th IEEE International On-Line Testing Symposium (IOLTS 2004), 2004

Complementary Circuits for On-Line Detection for 1-out-of-3 Codes.

Andrej A. Morosov, Michael Gössel, Valerij V. Saposhnikov, Vladimir V. Saposhnikov

Proceedings of the ARCS 2004, 2004

2000

New Self-dual Circuits for Error Detection and Testing.

Alexej Dmitriev, Valerij V. Saposhnikov, Vladimir V. Saposhnikov, Michael Gössel, V. Moshanin, Andrej A. Morosov

VLSI Design, 2000

New Self-Checking Circuits by Use of Berger-Codes.

Andrej A. Morosov, Valerij V. Saposhnikov, Vladimir V. Saposhnikov, Michael Gössel

Proceedings of the 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 2000

A New Method for Concurrent Checking by Use of a 1-out-of-4 Code.

Michael Gössel, Alexej Dmitriev, Vladimir V. Saposhnikov, Valerij V. Saposhnikov

Proceedings of the 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 2000

A New Method of Redundancy Addition for Circuit Optimization.

Vitalij Ocheretnij, Michael Gössel, Vladimir V. Saposhnikov, Valerij V. Saposhnikov

Proceedings of the 26th EUROMICRO 2000 Conference, 2000

1999

Experimental Results for Self-Dual Multi-Output Combinational Circuits.

Vladimir V. Saposhnikov, V. Moshanin, Valerij V. Saposhnikov, Michael Gössel

J. Electron. Test., 1999

1998

Self-Checking Combinational Circuits with Unidirectionally Independent Outputs.

Andrej A. Morosov, Valerij V. Saposhnikov, Vladimir V. Saposhnikov, Michael Gössel

VLSI Design, 1998

A New Design Method for Self-Checking Unidirectional Combinational Circuits.

Valerij V. Saposhnikov, Andrej A. Morosov, Vladimir V. Saposhnikov, Michael Gössel

J. Electron. Test., 1998

Self-Dual Duplication for Error Detection.

Vladimir V. Saposhnikov, Valerij V. Saposhnikov, Alexej Dmitriev, Michael Gössel

Proceedings of the 7th Asian Test Symposium (ATS '98), 2-4 December 1998, Singapore, 1998

1996

Self-dual parity checking-A new method for on-line testing.

Vladimir V. Saposhnikov, Alexej Dmitriev, Michael Gössel, Valerij V. Saposhnikov

Proceedings of the 14th IEEE VLSI Test Symposium (VTS'96), April 28, 1996