V. Reddy
According to our database1,
V. Reddy
authored at least 3 papers
between 2007 and 2014.
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Bibliography
2014
OFF-state degradation and correlated gate dielectric breakdown in high voltage drain extended transistors: A review.
Microelectron. Reliab., 2014
2007
Probing negative bias temperature instability using a continuum numerical framework: Physics to real world operation.
Microelectron. Reliab., 2007
S3: The IBM Smart Surveillance System: From Transactional Systems to Observational Systems.
Proceedings of the IEEE International Conference on Acoustics, 2007