V. Prasanth

According to our database, V. Prasanth authored at least 10 papers between 2008 and 2021.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2021

Exploiting Application Tolerance for Functional Safety.

V. Prasanth, Rubin A. Parekhji, Bharadwaj Amrutur

Proceedings of the IEEE International Test Conference, 2021

2020

Continuous Control Set Model Predictive Control of Buck Converter.

V. Prasanth, Venki Natarajan, Kaushik Basu

Proceedings of the 46th Annual Conference of the IEEE Industrial Electronics Society, 2020

2019

Perturbation Based Workload Augmentation for Comprehensive Functional Safety Analysis.

V. Prasanth, Rubin A. Parekhji, Bharadwaj Amrutur

Proceedings of the 32nd International Conference on VLSI Design and 18th International Conference on Embedded Systems, 2019

2017

Safety analysis for integrated circuits in the context of hybrid systems.

V. Prasanth, Rubin A. Parekhji, Bharadwaj Amrutur

Proceedings of the IEEE International Test Conference, 2017

Demystifying automotive safety and security for semiconductor developer.

V. Prasanth, David Foley, Srivaths Ravi

Proceedings of the IEEE International Test Conference, 2017

2015

Improved Methods for Accurate Safety Analysis of Real-Life Systems.

V. Prasanth, Rubin A. Parekhji, Bharadwaj S. Amrutur

Proceedings of the 24th IEEE Asian Test Symposium, 2015

2012

Derating based hardware optimizations in soft error tolerant designs.

V. Prasanth, Virendra Singh, Rubin A. Parekhji

Proceedings of the 30th IEEE VLSI Test Symposium, 2012

2011

Reduced overhead soft error mitigation using error control coding techniques.

V. Prasanth, Virendra Singh, Rubin A. Parekhji

Proceedings of the 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 2011

2010

Robust detection of soft errors using delayed capture methodology.

V. Prasanth, Virendra Singh, Rubin A. Parekhji

Proceedings of the 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 2010

2008

DFT Implementationis for Striking the Right Balance between Test Cost and Test Quality for Automotive SOCs.

Amit Dutta, Srinivasulu Alampally, V. Prasanth, Rubin A. Parekhji

Proceedings of the 2008 IEEE International Test Conference, 2008