V. Pean

According to our database, V. Pean authored at least 1 paper in 2008.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2008

Dynamic stress method for accurate NVM oxide robustness evaluation for automotive applications.

D. Pic, Arnaud Régnier, V. Pean, Jean-Luc Ogier, Didier Goguenheim

Microelectron. Reliab., 2008