V. Pathirana

According to our database, V. Pathirana authored at least 2 papers between 2017 and 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2018

Impact of underfill and other physical dimensions on Silicon Lateral IGBT package reliability using computer model with discrete and continuous design variables.

Pushparajah Rajaguru, H. Lu, Chris Bailey, Alberto Castellazzi, V. Pathirana, N. Udugampola, Florin Udrea

Microelectron. Reliab., 2018

2017

Single event effects and total ionising dose in 600V Si-on-SiC LDMOS transistors for rad-hard space applications.

K. Ben Ali, P. M. Gammon, C. W. Chan, F. Li, V. Pathirana, T. Trajkovic, Farzan Gity, Denis Flandre, Valeria Kilchytska

Proceedings of the 47th European Solid-State Device Research Conference, 2017