V. Mosser

According to our database, V. Mosser authored at least 1 paper in 2005.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of six.

2005

Robust, versatile, direct low-frequency noise characterization method for material/process quality control using cross-shaped 4-terminal devices.

A. Kerlain, V. Mosser

Microelectron. Reliab., 2005