Uygar E. Avci

According to our database, Uygar E. Avci authored at least 2 papers between 2014 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2020

Reliability Characteristics of a High Density Metal- Insulator-Metal Capacitor on Intel's 10+ Process.

Cheyun Lin, Uygar E. Avci, M. A. Blount, Rohit Grover, Jeffery Hicks, R. Kasim, A. Kundu, C. M. Pelto, C. Ryder, Anthony Schmitz, K. Sethi, D. Seghete, D. J. Towner, A. J. Welsh, J. Weber, C. Auth

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2014

Design of Low Voltage Tunneling-FET Logic Circuits Considering Asymmetric Conduction Characteristics.

Daniel H. Morris, Uygar E. Avci, Rafael Rios, Ian A. Young

IEEE J. Emerg. Sel. Topics Circuits Syst., 2014