Uwe Gläser

According to our database, Uwe Gläser authored at least 21 papers between 1989 and 1999.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

1999

SymFony: a hybrid topological-symbolic ATPG exploiting RT-level information.

Fulvio Corno, Uwe Gläser, Paolo Prinetto, Matteo Sonza Reorda, Heinrich Theodor Vierhaus, Massimo Violante

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1999

Modell Evaluation Using Genetic Manipulation Techniques.

H.-Ch. Dahmen, Uwe Gläser, Zoran Stamenkovic

Proceedings of the 9th Great Lakes Symposium on VLSI (GLS-VLSI '99), 1999

1998

The Impact of Area Optimization for the Power Consumption of Controllers.

H.-Ch. Dahmen, Uwe Gläser

Proceedings of the 24th EUROMICRO '98 Conference, 1998

1997

A Parallel Approach Solving the Test Generation Problem for Synchronous Sequential Circuits.

H.-Ch. Dahmen, Uwe Gläser, Heinrich Theodor Vierhaus

Proceedings of the Parallel Computing: Fundamentals, 1997

An Efficient Dynamic Parallel Approach to Automatic Test Pattern Generation.

H.-Ch. Dahmen, Uwe Gläser, Heinrich Theodor Vierhaus

Proceedings of the 7th Great Lakes Symposium on VLSI (GLS-VLSI '97), 1997

1996

Mixed level test generation for synchronous sequential circuits using the FOGBUSTER algorithm.

Uwe Gläser, Heinrich Theodor Vierhaus

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1996

Automatic Test Pattern Generation with Optimal Load Balancing.

H.-Ch. Dahmen, Uwe Gläser, Heinrich Theodor Vierhaus

Proceedings of the Parallel Virtual Machine, 1996

An ATPG-Based Framework for Verifying Sequential Equivalence.

Shi-Yu Huang, Kwang-Ting Cheng, Kuang-Chien Chen, Uwe Gläser

Proceedings of the Proceedings IEEE International Test Conference 1996, 1996

1995

Improving topological ATPG with symbolic techniques.

Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda, Uwe Gläser, Heinrich Theodor Vierhaus

Proceedings of the 13th IEEE VLSI Test Symposium (VTS'95), April 30, 1995

FOGBUSTER: an efficient algorithm for sequential test generation.

Uwe Gläser, Heinrich Theodor Vierhaus

Proceedings of the Proceedings EURO-DAC'95, 1995

Systems Level Specification and Modeling of Reactive Systems: Concepts, Methods, and Tools.

Uwe Gläser

Proceedings of the Computer Aided Systems Theory, 1995

Gate delay fault test generation for non-scan circuits.

G. Van Brakel, Uwe Gläser, Hans G. Kerkhoff, Heinrich Theodor Vierhaus

Proceedings of the 1995 European Design and Test Conference, 1995

Logic optimization by an improved sequential redundancy addition and removal techniques.

Uwe Gläser, Kwang-Ting Cheng

Proceedings of the 1995 Conference on Asia Pacific Design Automation, Makuhari, Massa, Chiba, Japan, August 29, 1995

1994

Mehrebenen-Testgenerierung für synchrone Schaltwerke.

Uwe Gläser

PhD thesis, 1994

Testability Analysis for Test Generation in Synchronous Sequential Circuits.

R. Wolber, Uwe Gläser, Heinrich Theodor Vierhaus

Proceedings of the Proceedings 1994 IEEE International Conference on Computer Design: VLSI in Computer & Processors, 1994

Test generation for bridging faults in CMOS ICs based on current monitoring versus signal propagation.

Uwe Gläser, Heinrich Theodor Vierhaus, M. Kley, A. Wiederhold

Proceedings of the 1994 IEEE/ACM International Conference on Computer-Aided Design, 1994

1993

Fault behavior and testability of asynchronous CMOS circuits.

Heinrich Theodor Vierhaus, Wolfgang Meyer, Uwe Gläser, Raul Camposano

Microprocess. Microprogramming, 1993

CMOS Bridges and Resistive Transistor Faults: I_DDQ versus Delay Effects.

Heinrich Theodor Vierhaus, Wolfgang Meyer, Uwe Gläser

Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

1992

Mixed Level Hierarchical Test Generation for Transition Faults and Overcurrent Related Defects.

Uwe Gläser, Uwe Hübner, Heinrich Theodor Vierhaus

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992

MILEF: an efficient approach to mixed level automatic test pattern generation.

Uwe Gläser, Heinrich Theodor Vierhaus

Proceedings of the conference on European design automation, 1992

1989

Fehlererkennung und Fehlertoleranz beim assoziativen RAM(ARAM)-Speicher.

Uwe Gläser, U. Steinhausen

Proceedings of the Fehlertolerierende Rechensysteme / Fault-Tolerant Computing Systems, 1989