Usha Sandeep Mehta

Orcid: 0000-0002-9917-5518

According to our database1, Usha Sandeep Mehta authored at least 13 papers between 2009 and 2018.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2018
Multiple Missing Cell Defect Modeling for QCA Devices.
J. Electron. Test., 2018

2016
Guest Editorial.
IET Comput. Digit. Tech., 2016

2015
Development of Radiation Hardened by Design(RHBD) primitive gates using 0.18μm CMOS technology.
Proceedings of the 19th International Symposium on VLSI Design and Test, 2015

A Hamming code based technique to resolve the bit flip impact on compressed VLSI test data in IP core based SoC.
Proceedings of the 19th International Symposium on VLSI Design and Test, 2015

2011
Weighted Transition Based Reordering, Columnwise Bit Filling, and Difference Vector: A Power-Aware Test Data Compression Method.
VLSI Design, 2011

Suitability of Various Low-Power Testing Techniques for IP Core-Based SoC: A Survey.
VLSI Design, 2011

Analysis of test data compression techniques emphasizing statistical coding schemes.
Proceedings of the ICWET '11 International Conference & Workshop on Emerging Trends in Technology, Mumbai, Maharashtra, India, February 25, 2011

2010
Run-Length-Based Test Data Compression Techniques: How Far from Entropy and Power Bounds? - A Survey.
VLSI Design, 2010

Modified Selective Huffman Coding for Optimization of Test Data Compression, Test Application Time and Area Overhead.
J. Electron. Test., 2010

Hamming Distance Based Reordering and Columnwise Bit Stuffing with Difference Vector: A Better Scheme for Test Data Compression with Run Length Based Codes.
Proceedings of the VLSI Design 2010: 23rd International Conference on VLSI Design, 2010

Hamming Distance Based 2-D Reordering with Power Efficient Don't Care Bit Filling: Optimizing the test data compression method.
Proceedings of the 2010 International Symposium on System on Chip, SoC 2010, Tampere, 2010

Combining unspecified test data bit filling methods and run length based codes to estimate compression, power and area overhead.
Proceedings of the IEEE Asia Pacific Conference on Circuits and Systems, 2010

2009
Survey of Test Data Compression Technique Emphasizing Code Based Schemes.
Proceedings of the 12th Euromicro Conference on Digital System Design, 2009


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