Urban Ingelsson

According to our database, Urban Ingelsson authored at least 25 papers between 2005 and 2017.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2017

Test Planning for Core-based Integrated Circuits under Power Constraints.

Breeta SenGupta, Dimitar Nikolov, Urban Ingelsson, Erik Larsson

J. Electron. Test., 2017

2016

Addressing Model Complexity in Automotive System Development - Selection of System Model Elements for Allocation of Requirements.

Grischa Liebel, Andreea Olaru, Henrik Lönn, Henrik Kaijser, Sunith Rajendran, Urban Ingelsson, Richard Berntsson-Svensson

Proceedings of the MODELSWARD 2016, 2016

2015

Abort-on-Fail Test Scheduling for Modular SOCs without and with Preemption.

Urban Ingelsson, Sandeep Kumar Goel, Erik Larsson, Erik Jan Marinissen

IEEE Trans. Computers, 2015

2014

Evaluation of Level of Confidence and Optimization of Roll-back Recovery with Checkpointing for Real-Time Systems.

Dimitar Nikolov, Urban Ingelsson, Virendra Singh, Erik Larsson

Microelectron. Reliab., 2014

Collaborative Development of Safety-Critical Automotive Systems: Exchange, Views and Metrics.

Johan Ekberg, Urban Ingelsson, Henrik Lönn, Magnus Skoog, Jan Söderberg

Proceedings of the Computer Safety, Reliability, and Security, 2014

Fault injection and fault handling: An MPSoC demonstrator using IEEE P1687.

Kim Petersén, Dimitar Nikolov, Urban Ingelsson, Gunnar Carlsson, Farrokh Ghani Zadegan, Erik Larsson

Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium, 2014

2012

Access Time Analysis for IEEE P1687.

Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson, Erik Larsson

IEEE Trans. Computers, 2012

Scheduling Tests for 3D Stacked Chips under Power Constraints.

Breeta SenGupta, Urban Ingelsson, Erik Larsson

J. Electron. Test., 2012

Reusing and Retargeting On-Chip Instrument Access Procedures in IEEE P1687.

Farrokh Ghani Zadegan, Urban Ingelsson, Erik Larsson, Gunnar Carlsson

IEEE Des. Test Comput., 2012

Test Planning for Core-based 3D Stacked ICs with Through-Silicon Vias.

Breeta SenGupta, Urban Ingelsson, Erik Larsson

Proceedings of the 25th International Conference on VLSI Design, 2012

Requirement Decomposition and Testability in Development of Safety-Critical Automotive Components, .

Viacheslav Izosimov, Urban Ingelsson, Andreas Wallin

Proceedings of the Computer Safety, Reliability, and Security, 2012

Test tool qualification through fault injection.

Q. Wang, Andreas Wallin, Viacheslav Izosimov, Urban Ingelsson, Zebo Peng

Proceedings of the 17th IEEE European Test Symposium, 2012

2011

Investigation into voltage and process variation-aware manufacturing test.

Urban Ingelsson, Bashir M. Al-Hashimi

Proceedings of the 2011 IEEE International Test Conference, 2011

Level of confidence evaluation and its usage for Roll-back Recovery with Checkpointing optimization.

Dimitar Nikolov, Urban Ingelsson, Virendra Singh, Erik Larsson

Proceedings of the IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W 2011), 2011

Measurement point selection for in-operation wear-out monitoring.

Urban Ingelsson, Shih-Yen Chang, Erik Larsson

Proceedings of the 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2011

Design automation for IEEE P1687.

Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson, Erik Larsson

Proceedings of the Design, Automation and Test in Europe, 2011

Test Scheduling in an IEEE P1687 Environment with Resource and Power Constraints.

Farrokh Ghani Zadegan, Urban Ingelsson, Golnaz Asani, Gunnar Carlsson, Erik Larsson

Proceedings of the 20th IEEE Asian Test Symposium, 2011

2010

Estimating Error-probability and its Application for Optimizing Roll-back Recovery with Checkpointing.

Dimitar Nikolov, Urban Ingelsson, Virendra Singh, Erik Larsson

Proceedings of the Fifth IEEE International Symposium on Electronic Design, 2010

Test Time Analysis for IEEE P1687.

Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson, Erik Larsson

Proceedings of the 19th IEEE Asian Test Symposium, 2010

Efficient Embedding of Deterministic Test Data.

Mudassar Majeed, Daniel Ahlstrom, Urban Ingelsson, Gunnar Carlsson, Erik Larsson

Proceedings of the 19th IEEE Asian Test Symposium, 2010

2009

Process Variation-Aware Test for Resistive Bridges.

Urban Ingelsson, Bashir M. Al-Hashimi, S. Saqib Khursheed, Sudhakar M. Reddy, Peter Harrod

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2009

2008

Bridging Fault Test Method With Adaptive Power Management Awareness.

S. Saqib Khursheed, Urban Ingelsson, Paul M. Rosinger, Bashir M. Al-Hashimi, Peter Harrod

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2008

Variation Aware Analysis of Bridging Fault Testing.

Urban Ingelsson, Bashir M. Al-Hashimi, Peter Harrod

Proceedings of the 17th IEEE Asian Test Symposium, 2008

2007

Resistive Bridging Faults DFT with Adaptive Power Management Awareness.

Urban Ingelsson, Paul M. Rosinger, S. Saqib Khursheed, Bashir M. Al-Hashimi, Peter Harrod

Proceedings of the 16th Asian Test Symposium, 2007

2005

Test scheduling for modular SOCs in an abort-on-fail environment.

Urban Ingelsson, Sandeep Kumar Goel, Erik Larsson, Erik Jan Marinissen

Proceedings of the 10th European Test Symposium, 2005