Ulrich Backhausen

According to our database, Ulrich Backhausen authored at least 3 papers between 2012 and 2017.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2017

Robustness in automotive electronics: An industrial overview of major concerns.

Ulrich Backhausen, Oscar Ballan, Paolo Bernardi, Sergio de Luca, Julie Henzler, Thomas Kern, Davide Piumatti, Thomas Rabenalt, Krishnapriya Chakiat Ramamoorthy, Ernesto Sánchez, Alessandro Sansonetti, Rudolf Ullmann, Federico Venini, Robert Wiesner

Proceedings of the 23rd IEEE International Symposium on On-Line Testing and Robust System Design, 2017

2013

A 65nm 4MB embedded flash macro for automotive achieving a read throughput of 5.7GB/s and a write throughput of 1.4MB/s.

Mihail Jefremow, Thomas Kern, Ulrich Backhausen, J. Elbs, B. Rousseau, Christoph Roll, L. Castro, T. Roehr, E. Paparisto, K. Herfurth, R. Bartenschlager, Stefanie Thierold, R. Renardy, Stephan Kassenetter, N. Lawal, M. Strasser, W. Trottmann, Doris Schmitt-Landsiedel

Proceedings of the ESSCIRC 2013, 2013

2012

Bitline-capacitance-cancelation sensing scheme with 11ns read latency and maximum read throughput of 2.9GB/s in 65nm embedded flash for automotive.

Mihail Jefremow, Thomas Kern, Ulrich Backhausen, Christian Peters, Christoph Parzinger, Christoph Roll, Stephan Kassenetter, Stefanie Thierold, Doris Schmitt-Landsiedel

Proceedings of the 2012 IEEE International Solid-State Circuits Conference, 2012