Ujjwal Guin

According to our database, Ujjwal Guin authored at least 63 papers between 2011 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2024

A Novel Self-referencing Approach Using Memory Power-up States for Detecting COTS SRAMs.

Gaines Odom, Zakia Tamanna Tisha, Ujjwal Guin

Proceedings of the 42nd IEEE VLSI Test Symposium, 2024

Exploring Security Solutions and Vulnerabilities for Embedded Non-Volatile Memories.

Zakia Tamanna Tisha, Jeremy Muldavin, Ujjwal Guin

Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2024

Blockchain-Enabled Whitelisting Mechanisms for Enhancing Security in 3D ICs.

Gaines Odom, Hardhik Mohanty, Ujjwal Guin, Bhaskar Krishnamachari

Proceedings of the Great Lakes Symposium on VLSI 2024, 2024

2023

Complexity Analysis of the SAT Attack on Logic Locking.

Yadi Zhong, Ujjwal Guin

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., October, 2023

A Comprehensive Test Pattern Generation Approach Exploiting the SAT Attack for Logic Locking.

Yadi Zhong, Ujjwal Guin

IEEE Trans. Computers, August, 2023

On-Demand Device Authentication using Zero-Knowledge Proofs for Smart Systems.

Yadi Zhong, Joshua Hovanes, Ujjwal Guin

Proceedings of the Great Lakes Symposium on VLSI 2023, 2023

2022

Test and Yield Loss Reduction of AI and Deep Learning Accelerators.

Mehdi Sadi, Ujjwal Guin

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

AFIA: ATPG-Guided Fault Injection Attack on Secure Logic Locking.

Yadi Zhong, Ayush Jain, M. Tanjidur Rahman, Navid Asadizanjani, Jiafeng Xie, Ujjwal Guin

J. Electron. Test., 2022

A Systematic Bit Selection Method for Robust SRAM PUFs.

Wendong Wang, Adit D. Singh, Ujjwal Guin

J. Electron. Test., 2022

Beware of Discarding Used SRAMs: Information is Stored Permanently.

Joshua Hovanes, Yadi Zhong, Ujjwal Guin

CoRR, 2022

AFIA: ATPG-Guided Fault Injection Attack on Secure Logic Locking.

Yadi Zhong, Ujjwal Guin

CoRR, 2022

Lightweight Hardware Implementation of Binary Ring-LWE PQC Accelerator.

Benjamin J. Lucas, Ali Alwan, Marion Murzello, Yazheng Tu, Pengzhou He, Andrew J. Schwartz, David Guevara, Ujjwal Guin, Kyle Juretus, Jiafeng Xie

IEEE Comput. Archit. Lett., 2022

Fault Modeling and Test Generation for Technology-Specific Defects of Skyrmion Logic Circuits.

Ziqi Zhou, Ujjwal Guin, Peng Li, Vishwani D. Agrawal

Proceedings of the 40th IEEE VLSI Test Symposium, 2022

Chosen-Plaintext Attack on Energy-Efficient Hardware Implementation of GIFT-COFB.

Yadi Zhong, Ujjwal Guin

Proceedings of the IEEE International Symposium on Hardware Oriented Security and Trust, 2022

Fault-Injection Based Chosen-Plaintext Attacks on Multicycle AES Implementations.

Yadi Zhong, Ujjwal Guin

Proceedings of the GLSVLSI '22: Great Lakes Symposium on VLSI 2022, Irvine CA USA, June 6, 2022

CamSkyGate: camouflaged skyrmion gates for protecting ICs.

Yuqiao Zhang, Chunli Tang, Peng Li, Ujjwal Guin

Proceedings of the DAC '22: 59th ACM/IEEE Design Automation Conference, San Francisco, California, USA, July 10, 2022

2021

TAAL: Tampering Attack on Any Key-based Logic Locked Circuits.

Ayush Jain, Ziqi Zhou, Ujjwal Guin

ACM Trans. Design Autom. Electr. Syst., 2021

A novel topology-guided attack and its countermeasure towards secure logic locking.

Yuqiao Zhang, Ayush Jain, Pinchen Cui, Ziqi Zhou, Ujjwal Guin

J. Cryptogr. Eng., 2021

Estimating Operational Age of an Integrated Circuit.

Prattay Chowdhury, Ujjwal Guin, Adit D. Singh, Vishwani D. Agrawal

J. Electron. Test., 2021

Novel Low-Complexity Polynomial Multiplication Over Hybrid Fields for Efficient Implementation of Binary Ring-LWE Post-Quantum Cryptography.

Pengzhou He, Ujjwal Guin, Jiafeng Xie

IEEE J. Emerg. Sel. Topics Circuits Syst., 2021

Special Session: Reliability Analysis for ML/AI Hardware.

Shamik Kundu, Kanad Basu, Mehdi Sadi, Twisha Titirsha, Shihao Song, Anup Das, Ujjwal Guin

CoRR, 2021

Defect Characterization and Testing of Skyrmion-Based Logic Circuits.

Ziqi Zhou, Ujjwal Guin, Peng Li, Vishwani D. Agrawal

Proceedings of the 39th IEEE VLSI Test Symposium, 2021

Special Session: Reliability Analysis for AI/ML Hardware.

Shamik Kundu, Kanad Basu, Mehdi Sadi, Twisha Titirsha, Shihao Song, Anup Das, Ujjwal Guin

Proceedings of the 39th IEEE VLSI Test Symposium, 2021

Survey of Recent Developments for Hardware Trojan Detection.

Ayush Jain, Ziqi Zhou, Ujjwal Guin

Proceedings of the IEEE International Symposium on Circuits and Systems, 2021

A Blockchain-based Contactless Delivery System for Addressing COVID-19 and Other Pandemics.

Pratiksha Mittal, Austin Walthall, Pinchen Cui, Anthony Skjellum, Ujjwal Guin

Proceedings of the 2021 IEEE International Conference on Blockchain, 2021

2020

End-to-End Traceability of ICs in Component Supply Chain for Fighting Against Recycling.

Yuqiao Zhang, Ujjwal Guin

IEEE Trans. Inf. Forensics Secur., 2020

Aging-Resilient SRAM-based True Random Number Generator for Lightweight Devices.

Wendong Wang, Ujjwal Guin, Adit D. Singh

J. Electron. Test., 2020

A Robust, Low-Cost and Secure Authentication Scheme for IoT Applications.

Md Jubayer al Mahmod, Ujjwal Guin

Cryptogr., 2020

ATPG-Guided Fault Injection Attacks on Logic Locking.

Ayush Jain, M. Tanjidur Rahman, Ujjwal Guin

CoRR, 2020

Benchmarking at the Frontier of Hardware Security: Lessons from Logic Locking.

Benjamin Tan, Ramesh Karri, Nimisha Limaye, Abhrajit Sengupta, Ozgur Sinanoglu, Md. Moshiur Rahman, Swarup Bhunia, Danielle Duvalsaint, Ronald D. Blanton, Amin Rezaei, Yuanqi Shen, Hai Zhou, Leon Li, Alex Orailoglu, Zhaokun Han, Austin Benedetti, Luciano Brignone, Muhammad Yasin, Jeyavijayan Rajendran, Michael Zuzak, Ankur Srivastava, Ujjwal Guin, Chandan Karfa, Kanad Basu, Vivek V. Menon, Matthew French, Peilin Song, Franco Stellari, Gi-Joon Nam, Peter Gadfort, Alric Althoff, Joseph Tostenrude, Saverio Fazzari, Eric Breckenfeld, Kenneth Plaks

CoRR, 2020

Yield Loss Reduction and Test of AI and Deep Learning Accelerators.

Mehdi Sadi, Ujjwal Guin

CoRR, 2020

Special Session: The Recent Advance in Hardware Implementation of Post-Quantum Cryptography.

Jiafeng Xie, Kanad Basu, Kris Gaj, Ujjwal Guin

Proceedings of the 38th IEEE VLSI Test Symposium, 2020

A Zero-Cost Detection Approach for Recycled ICs using Scan Architecture.

Wendong Wang, Ujjwal Guin, Adit D. Singh

Proceedings of the 38th IEEE VLSI Test Symposium, 2020

Special Session: Novel Attacks on Logic-Locking.

Ayush Jain, Ujjwal Guin, M. Tanjidur Rahman, Navid Asadizanjani, Danielle Duvalsaint, R. D. Shawn Blanton

Proceedings of the 38th IEEE VLSI Test Symposium, 2020

A Novel Tampering Attack on AES Cores with Hardware Trojans.

Ayush Jain, Ujjwal Guin

Proceedings of the IEEE International Test Conference in Asia, 2020

2019

Standards for Hardware Security.

Ujjwal Guin, Navid Asadizanjani, Mark M. Tehranipoor

GetMobile Mob. Comput. Commun., 2019

Blockchain in IoT: Current Trends, Challenges, and Future Roadmap.

Pinchen Cui, Ujjwal Guin, Anthony Skjellum, David A. Umphress

J. Hardw. Syst. Secur., 2019

Low-Cost and Secure Firmware Obfuscation Method for Protecting Electronic Systems From Cloning.

Benjamin Cyr, Jubayer Mahmod, Ujjwal Guin

IEEE Internet Things J., 2019

A Blockchain-Based Framework for Supply Chain Provenance.

Pinchen Cui, Julie Dixon, Ujjwal Guin, Daniel DiMase

IEEE Access, 2019

Special Session: Delay Fault Testing - Present and Future.

Jubayer Mahmod, Spencer K. Millican, Ujjwal Guin, Vishwani D. Agrawal

Proceedings of the 37th IEEE VLSI Test Symposium, 2019

Two-Pattern ∆IDDQ Test for Recycled IC Detection.

Prattay Chowdhury, Ujjwal Guin, Adit D. Singh, Vishwani D. Agrawal

Proceedings of the 32nd International Conference on VLSI Design and 18th International Conference on Embedded Systems, 2019

Countering Botnet of Things using Blockchain-Based Authenticity Framework.

Pinchen Cui, Ujjwal Guin

Proceedings of the 2019 IEEE Computer Society Annual Symposium on VLSI, 2019

Detecting Recycled SoCs by Exploiting Aging Induced Biases in Memory Cells.

Ujjwal Guin, Wendong Wang, Charles Harper, Adit D. Singh

Proceedings of the IEEE International Symposium on Hardware Oriented Security and Trust, 2019

TGA: An Oracle-less and Topology-Guided Attack on Logic Locking.

Yuqiao Zhang, Pinchen Cui, Ziqi Zhou, Ujjwal Guin

Proceedings of the 3rd ACM Workshop on Attacks and Solutions in Hardware Security Workshop, 2019

2018

Robust Design-for-Security Architecture for Enabling Trust in IC Manufacturing and Test.

Ujjwal Guin, Ziqi Zhou, Adit D. Singh

IEEE Trans. Very Large Scale Integr. Syst., 2018

Modeling and test generation for combinational hardware Trojans.

Ziqi Zhou, Ujjwal Guin, Vishwani D. Agrawal

Proceedings of the 36th IEEE VLSI Test Symposium, 2018

A Secure Low-Cost Edge Device Authentication Scheme for the Internet of Things.

Ujjwal Guin, Adit D. Singh, Mahabubul Alam, Janice Canedo, Anthony Skjellum

Proceedings of the 31st International Conference on VLSI Design and 17th International Conference on Embedded Systems, 2018

Exploiting power supply ramp rate for calibrating cell strength in SRAM PUFs.

Wendong Wang, Adit D. Singh, Ujjwal Guin, Abhijit Chatterjee

Proceedings of the 19th IEEE Latin-American Test Symposium, 2018

Ensuring Proof-of-Authenticity of IoT Edge Devices Using Blockchain Technology.

Ujjwal Guin, Pinchen Cui, Anthony Skjellum

Proceedings of the IEEE International Conference on Internet of Things (iThings) and IEEE Green Computing and Communications (GreenCom) and IEEE Cyber, 2018

Robust, low-cost, and accurate detection of recycled ICs using digital signatures.

Mahabubul Alam, Sreeja Chowdhury, Mark M. Tehranipoor, Ujjwal Guin

Proceedings of the 2018 IEEE International Symposium on Hardware Oriented Security and Trust, 2018

2017

SMA: A System-Level Mutual Authentication for Protecting Electronic Hardware and Firmware.

Ujjwal Guin, Swarup Bhunia, Domenic Forte, Mark M. Tehranipoor

IEEE Trans. Dependable Secur. Comput., 2017

TSensors Vision, Infrastructure and Security Challenges in Trillion Sensor Era.

Mahabubul Alam, Mark M. Tehranipoor, Ujjwal Guin

J. Hardw. Syst. Secur., 2017

A novel design-for-security (DFS) architecture to prevent unauthorized IC overproduction.

Ujjwal Guin, Ziqi Zhou, Adit D. Singh

Proceedings of the 35th IEEE VLSI Test Symposium, 2017

2016

Design of Accurate Low-Cost On-Chip Structures for Protecting Integrated Circuits Against Recycling.

Ujjwal Guin, Domenic Forte, Mark M. Tehranipoor

IEEE Trans. Very Large Scale Integr. Syst., 2016

FORTIS: A Comprehensive Solution for Establishing Forward Trust for Protecting IPs and ICs.

Ujjwal Guin, Qihang Shi, Domenic Forte, Mark M. Tehranipoor

ACM Trans. Design Autom. Electr. Syst., 2016

2015

Performance optimization for on-chip sensors to detect recycled ICs.

Bicky Shakya, Ujjwal Guin, Mark M. Tehranipoor, Domenic Forte

Proceedings of the 33rd IEEE International Conference on Computer Design, 2015

2014

Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain.

Ujjwal Guin, Ke Huang, Daniel DiMase, John M. Carulli, Mohammad Tehranipoor, Yiorgos Makris

Proc. IEEE, 2014

A Comprehensive Framework for Counterfeit Defect Coverage Analysis and Detection Assessment.

Ujjwal Guin, Daniel DiMase, Mohammad Tehranipoor

J. Electron. Test., 2014

Counterfeit Integrated Circuits: Detection, Avoidance, and the Challenges Ahead.

Ujjwal Guin, Daniel DiMase, Mohammad Tehranipoor

J. Electron. Test., 2014

Low-cost On-Chip Structures for Combating Die and IC Recycling.

Ujjwal Guin, Xuehui Zhang, Domenic Forte, Mohammad Tehranipoor

Proceedings of the 51st Annual Design Automation Conference 2014, 2014

2013

Anti-counterfeit Techniques: From Design to Resign.

Ujjwal Guin, Domenic Forte, Mohammad Tehranipoor

Proceedings of the 14th International Workshop on Microprocessor Test and Verification, 2013

Functional Fmax test-time reduction using novel DFTs for circuit initialization.

Ujjwal Guin, Tapan J. Chakraborty, Mohammad Tehranipoor

Proceedings of the 2013 IEEE 31st International Conference on Computer Design, 2013

2011

Design for Bit Error Rate estimation of high speed serial links.

Ujjwal Guin, Chen-Huan Chiang

Proceedings of the 29th IEEE VLSI Test Symposium, 2011