Ujjal Kr Dutta

Dhruba K. Bhattacharyya

CoRR, 2022

Seeing Objects in Dark with Continual Contrastive Learning.

[BibT_eX]

[DOI]

Proceedings of the Computer Vision - ECCV 2022 Workshops, 2022

Fuse and Attend: Generalized Embedding Learning for Art and Sketches.

[BibT_eX]

[DOI]

Proceedings of the Computer Vision - ECCV 2022 Workshops, 2022

A Tale of Color Variants: Representation and Self-Supervised Learning in Fashion E-commerce.

[BibT_eX]

[DOI]

Proceedings of the Thirty-Sixth AAAI Conference on Artificial Intelligence, 2022

2021

Seeing BDD100K in dark: Single-Stage Night-time Object Detection via Continual Fourier Contrastive Learning.

[BibT_eX]

[DOI]

CoRR, 2021

Color Variants Identification via Contrastive Self-Supervised Representation Learning.

[BibT_eX]

[DOI]

CoRR, 2021

Buy Me That Look: An Approach for Recommending Similar Fashion Products.

[BibT_eX]

[DOI]

Proceedings of the 4th IEEE International Conference on Multimedia Information Processing and Retrieval, 2021

Semi-Supervised Metric Learning: A Deep Resurrection.

[BibT_eX]

[DOI]

Proceedings of the Thirty-Fifth AAAI Conference on Artificial Intelligence, 2021

Attr2Style: A Transfer Learning Approach for Inferring Fashion Styles via Apparel Attributes.

[BibT_eX]

[DOI]

Rajdeep H. Banerjee

Abhinav Ravi

Proceedings of the Thirty-Fifth AAAI Conference on Artificial Intelligence, 2021

2020

Unsupervised Deep Metric Learning via Orthogonality Based Probabilistic Loss.

[BibT_eX]

[DOI]

IEEE Trans. Artif. Intell., 2020

Affinity guided Geometric Semi-Supervised Metric Learning.

[BibT_eX]

[DOI]

CoRR, 2020

A Geometric Approach for Unsupervised Similarity Learning.

[BibT_eX]

[DOI]

Proceedings of the 2020 IEEE International Conference on Acoustics, 2020

Unsupervised Metric Learning with Synthetic Examples.

[BibT_eX]

[DOI]

Proceedings of the Thirty-Fourth AAAI Conference on Artificial Intelligence, 2020

2019

A Probabilistic approach for Learning Embeddings without Supervision.

[BibT_eX]

[DOI]

CoRR, 2019

2018

Subspace Segmentation Based Metric Learning.

[BibT_eX]

[DOI]

Proceedings of the 2018 IEEE International Conference on Image Processing, 2018

Affinity Propagation Based Closed-Form Semi-supervised Metric Learning Framework.

[BibT_eX]

[DOI]