Udo Mahlstedt

According to our database, Udo Mahlstedt authored at least 9 papers between 1990 and 1995.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of four.

1995

CURRENT: a test generation system for I_DDQ testing.

Udo Mahlstedt, Jürgen Alt, Matthias Heinitz

Proceedings of the 13th IEEE VLSI Test Symposium (VTS'95), April 30, 1995

Deterministic test generation for non-classical faults on the gate level.

Udo Mahlstedt, Jürgen Alt, Ingo Hollenbeck

Proceedings of the 4th Asian Test Symposium (ATS '95), 1995

1993

Simulation of non-classical faults on the gate level-fault modeling.

Jürgen Alt, Udo Mahlstedt

Proceedings of the 11th IEEE VLSI Test Symposium (VTS'93), 1993

Simulation of non-classical Faults on the Gate Level - The Fault Simulator COMISM -.

Udo Mahlstedt, Jürgen Alt

Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

DELTEST: Deterministic Test Generation for Gate-Delay Faults.

Udo Mahlstedt

Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

1992

Test generation for IDDQ testing and leakage fault detection in CMOS circuits.

Udo Mahlstedt, Matthias Heinitz, Jürgen Alt

Proceedings of the conference on European design automation, 1992

1991

DIATEST: A Fast Diagnostic Test Pattern Generator for Combinational Circuits.

Torsten Grüning, Udo Mahlstedt, Hartmut Koopmeiners

Proceedings of the 1991 IEEE/ACM International Conference on Computer-Aided Design, 1991

1990

Contest: A Fast ATPG Tool for Very Large Combinatorial Circuits.

Udo Mahlstedt, Torsten Grüning, Cengiz Özcan, Wilfried Daehn

Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 1990

Accelerated test pattern generation by cone-oriented circuit partitioning.

Torsten Grüning, Udo Mahlstedt, Wilfried Daehn, Cengiz Özcan

Proceedings of the European Design Automation Conference, 1990