Tsutomu Uesugi

According to our database, Tsutomu Uesugi authored at least 2 papers between 2014 and 2023.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2023

Reliability issues of gate oxides and $p-n$ junctions for vertical GaN metal-oxide-semiconductor field-effect transistors (Invited).

Tetsuo Narita, Daigo Kikuta, Kenji Ito, Tomoyuki Shoji, Tomohiko Mori, Satoshi Yamaguchi, Yasuji Kimoto, Kazuyoshi Tomita, Masakazu Kanechika, Takeshi Kondo, Tsutomu Uesugi, Jun Kojima, Jun Suda, Yoshitaka Nagasato, Satoshi Ikeda, Hiroki Watanabe, Masayoshi Kosaki, Tohru Oka

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2014

Degradation analysis and current collapse imaging of AlGaN/GaN HEMTs by measurement of electric field-induced optical second-harmonic generation.

Takashi Katsuno, Takaaki Manaka, Tsuyoshi Ishikawa, Hiroyuki Ueda, Tsutomu Uesugi, Mitsumasa Iwamoto

Microelectron. Reliab., 2014