Tse-Heng Chou

According to our database, Tse-Heng Chou authored at least 1 paper in 2008.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of six.

2008

Effect of the pre-gate oxide cleaning temperature on the reliability of GOI and devices performances in deep submicron CMOS technology.

Yen-Ting Chiang, Yean-Kuen Fang, Y. J. Huang, Tse-Heng Chou, S. Y. Yeh, C. S. Lin

Microelectron. Reliab., 2008