Tristan Dubois

According to our database, Tristan Dubois authored at least 12 papers between 2008 and 2024.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of four.

2024

Susceptibility of an Analog Temperature Measurement Function: First Step to Optimize the IEMI Waveform.

Antoine Duguet, Tristan Dubois, Geneviève Duchamp, David Hardy, Franck Salvador

Proceedings of the 14th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, 2024

Enhancing High-Speed Ethernet Link Design at 25 Gbps in Aerospace Environments Through Optimization Algorithms.

Soazig Le Bihan, Tristan Dubois, Jean-Baptiste Bégueret, Adil El Abbazi

Proceedings of the 14th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, 2024

2020

Susceptibility Modelling of SMPS Input Stage Under High Current Pulse Injection.

L. Curos, Tristan Dubois, G. Mejecaze, F. Puybaret, Jean-Michel Vinassa

Proceedings of the 2020 IEEE International Conference on Industrial Technology, 2020

2018

Effects of HPEM stress on GaAs low-noise amplifier from circuit to component scale.

M. Girard, Tristan Dubois, Patrick Hoffmann, Geneviève Duchamp

Microelectron. Reliab., 2018

2017

Effects of ageing on the conducted immunity of a voltage reference: Experimental study and modelling approach.

S. Hairoud-Airieau, Geneviève Duchamp, Tristan Dubois, Jean-Yves Delétage, André Durier, Hélène Frémont

Microelectron. Reliab., 2017

2015

A New Method for the Characterization of Electronic Components Immunity.

Ala Ayed, Tristan Dubois, Jean-Luc Levant, Geneviève Duchamp

IEEE Trans. Instrum. Meas., 2015

Characterization and model of temperature effect on the conducted immunity of Op-Amp.

Tristan Dubois, Siham Hairoud, Marcio Hermany Gomes de Oliveira, Hélène Frémont, Geneviève Duchamp

Microelectron. Reliab., 2015

Failure mechanism study and immunity modeling of an embedded analog-to-digital converter based on immunity measurements.

Ala Ayed, Tristan Dubois, Jean-Luc Levant, Geneviève Duchamp

Microelectron. Reliab., 2015

2013

Conducted immunity of three Op-Amps using the DPI measurement technique and VHDL-AMS modeling.

Siham Hairoud, Tristan Dubois, Angelique Tetelin, Geneviève Duchamp

Proceedings of the 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, 2013

2011

First studies of the impact of dose radiation on the electromagnetic susceptibility of bipolar transistors.

Sylvie Jarrix, Laurent Dusseau, Nathalie Chatry, Patrick Hoffmann, Adrien Doridant, A. Blain, Tristan Dubois, Jérémy Raoult, Philippe Calvel

Proceedings of the 12th Latin American Test Workshop, 2011

2010

Probe Characterization for Electromagnetic Near-Field Studies.

Sylvie Jarrix, Tristan Dubois, R. Adam, Philippe Nouvel, Bruno Azaïs, Daniel Gasquet

IEEE Trans. Instrum. Meas., 2010

2008

Near-Field Electromagnetic Characterization and Perturbation of Logic Circuits.

Tristan Dubois, Sylvie Jarrix, Annick Penarier, Philippe Nouvel, Daniel Gasquet, Laurent Chusseau, Bruno Azaïs

IEEE Trans. Instrum. Meas., 2008