Toshio Ikeda

According to our database, Toshio Ikeda authored at least 4 papers between 2001 and 2004.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2004

Technique to Diagnose Open Defects that Takes Coupling Effects into Consideration.

Yasuo Sato, Iwao Yamazaki, Hiroki Yamanaka, Toshio Ikeda, Masahiro Takakura, Kazuhiko Iwasaki

IEICE Trans. Inf. Syst., 2004

2002

A Persistent Diagnostic Technique for Unstable Defects.

Yasuo Sato, Iwao Yamazaki, Hiroki Yamanaka, Toshio Ikeda, Masahiro Takakura

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001

An evaluation of defect-oriented test: WELL-controlled low voltage test.

Yasuo Sato, Masaki Kohno, Toshio Ikeda, Iwao Yamazaki, Masato Hamamoto

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

An Approach to Improve the Resolution of Defect-Based Diagnosis.

Iwao Yamazaki, Hiroki Yamanaka, Toshio Ikeda, Masahiro Takakura, Yasuo Sato

Proceedings of the 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, 2001