Toshiki Tsuboi

According to our database, Toshiki Tsuboi authored at least 5 papers between 2008 and 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2018

A 1.8e^-_rms Temporal Noise Over 110-dB-Dynamic Range 3.4µm Pixel Pitch Global-Shutter CMOS Image Sensor With Dual-Gain Amplifiers SS-ADC, Light Guide Structure, and Multiple-Accumulation Shutter.

Masahiro Kobayashi, Yusuke Onuki, Kazunari Kawabata, Hiroshi Sekine, Toshiki Tsuboi, Takashi Muto, Takeshi Akiyama, Yasushi Matsuno, Hidekazu Takahashi, Toru Koizumi, Katsuhito Sakurai, Hiroshi Yuzurihara, Shunsuke Inoue, Takeshi Ichikawa

IEEE J. Solid State Circuits, 2018

2017

Development of Gentle Slope Light Guide Structure in a 3.4 μm Pixel Pitch Global Shutter CMOS Image Sensor with Multiple Accumulation Shutter Technology.

Hiroshi Sekine, Masahiro Kobayashi, Yusuke Onuki, Kazunari Kawabata, Toshiki Tsuboi, Yasushi Matsuno, Hidekazu Takahashi, Shunsuke Inoue, Takeshi Ichikawa

Sensors, 2017

4.5 A 1.8erms^- temporal noise over 110dB dynamic range 3.4µm pixel pitch global shutter CMOS image sensor with dual-gain amplifiers, SS-ADC and multiple-accumulation shutter.

Masahiro Kobayashi, Yusuke Onuki, Kazunari Kawabata, Hiroshi Sekine, Toshiki Tsuboi, Yasushi Matsuno, Hidekazu Takahashi, Toru Koizumi, Katsuhito Sakurai, Hiroshi Yuzurihara, Shunsuke Inoue, Takeshi Ichikawa

Proceedings of the 2017 IEEE International Solid-State Circuits Conference, 2017

2016

6.4 An APS-H-Size 250Mpixel CMOS image sensor using column single-slope ADCs with dual-gain amplifiers.

Hirofumi Totsuka, Toshiki Tsuboi, Takashi Muto, Daisuke Yoshida, Yasushi Matsuno, Masanobu Ohmura, Hidekazu Takahashi, Katsuhito Sakurai, Takeshi Ichikawa, Hiroshi Yuzurihara, Shunsuke Inoue

Proceedings of the 2016 IEEE International Solid-State Circuits Conference, 2016

2008

Bodygraphic Information System: Application to Injury Surveillance.

Toshiki Tsuboi, Yoshifumi Nishida, Yoichi Motomura, Masaaki Mochimaru, Makiko Kouchi, Tatsuhiro Yamanaka, Hiroshi Mizoguchi

Proceedings of the 2008 International Conference on Modeling, 2008