Toshihiro Matsuda

According to our database, Toshihiro Matsuda authored at least 10 papers between 2005 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Raspbian Versus LineageOS: An Experimental Study on Raspberry Pi 4.

Toshihiro Matsuda, Yue Su, Yang Xiang, Kien Nguyen, Hiroo Sekiya

Proceedings of the 23rd International Symposium on Communications and Information Technologies, 2024

2022

Maximum Efficiency Tracking for Wireless Power Transfer with Multiple Receivers.

Toshihiro Matsuda, Yutaro Komiyama, Wenqi Zhu, Kien Nguyen, Hiroo Sekiya

Proceedings of the 19th International SoC Design Conference, 2022

2009

Current-Voltage Hysteresis Characteristics in MOS Capacitors with Si-Implanted Oxide.

Toshihiro Matsuda, Shinsuke Ishimaru, Shingo Nohara, Hideyuki Iwata, Kiyotaka Komoku, Takayuki Morishita, Takashi Ohzone

IEICE Trans. Electron., 2009

A V_DD independent temperature sensor circuit with scaled CMOS process.

H. Oshiyama, Toshihiro Matsuda, K. Suzuki, Hideyuki Iwata, Takashi Ohzone

Proceedings of the 14th Asia South Pacific Design Automation Conference, 2009

2008

A Test Structure for Asymmetry and Orientation Dependence Analysis of CMOSFETs.

Toshihiro Matsuda, Yuya Sugiyama, Keita Nohara, Kazuhiro Morita, Hideyuki Iwata, Takashi Ohzone, Takayuki Morishita, Kiyotaka Komoku

IEICE Trans. Electron., 2008

2007

A CMOS Temperature Sensor Circuit.

Takashi Ohzone, Tatsuaki Sadamoto, Takayuki Morishita, Kiyotaka Komoku, Toshihiro Matsuda, Hideyuki Iwata

IEICE Trans. Electron., 2007

A Test Structure to Analyze Electrical CMOSFET Reliabilities between Center and Edge along the Channel Width.

Takashi Ohzone, Eiji Ishii, Takayuki Morishita, Kiyotaka Komoku, Toshihiro Matsuda, Hideyuki Iwata

IEICE Trans. Electron., 2007

2006

A Test Structure to Analyze Highly-Doped-Drain and Lightly-Doped-Drain in CMOSFET.

Takashi Ohzone, Kazuhiko Okada, Takayuki Morishita, Kiyotaka Komoku, Toshihiro Matsuda, Hideyuki Iwata

IEICE Trans. Electron., 2006

2005

A Test Structure for Two-Dimensional Analysis of MOSFETs by Hot-Carrier-Induced Photoemission.

Toshihiro Matsuda, Hiroaki Takeuchi, Akira Muramatsu, Hideyuki Iwata, Takashi Ohzone, Kyoji Yamashita, Norio Koike, Ken-ichiro Tatsuuma

IEICE Trans. Electron., 2005

A Temperature and Supply Voltage Independent CMOS Voltage Reference Circuit.

Toshihiro Matsuda, Ryuichi Minami, Akira Kanamori, Hideyuki Iwata, Takashi Ohzone, Shinya Yamamoto, Takashi Ihara, Shigeki Nakajima

IEICE Trans. Electron., 2005